Malvern Panalytical Inc.

Malvern Instruments Limited

Robert Jack

Fraser McNeil-Watson

Jason Corbett

Malcolm Connah

David McKnight

Malcolm Trevor Connah

The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.

Surface charge measurement

Methods and apparatus for measuring particle characteristics are disclosed. In one aspect, an amount of light arising from interaction between light and a suspended sample is detected simultaneously with the acquisition of a photon count from a different direction. At least one measure of particle characteristics can then be derived based at least in part on timing between information from the steps of acquiring and detecting.

Light scattering measurements using simultaneous detection

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Bloomsgrove, United Kingdom

Robert Jack