Dh Technologies Development Pte. Ltd.

Robert Haufler

William Morgan Loyd

Takashi Baba

Bruce A Thomson

Martian Daniel Dima

Alexander Tsipirovich

Andrei Sonoc

Nicholas G Bloomfield

Igor Chernushevich

Systems and methods are disclosed for dynamically switching an ion guide and a TOF mass analyzer between concentrating or not concentrating ions in a targeted acquisition. Product ions are ejected from the ion guide into the TOF mass analyzer and the intensity of a known product ion is measured at two or more time steps. The ion guide initially ejects product ions using a sequential or Zeno pulsing mode that concentrates product ions with different m/z values within the TOF mass analyzer at the same time. If the intensity of the product ion is increasing and greater than a threshold intensity, the ion guide switches to a continuous or normal pulsing mode that does not concentrate ions with different m/z values in the TOF mass analyzer at the same time. Similarly, if the intensity decreases below a threshold in continuous mode, the ion guide switches back to sequential mode.

Dynamically concentrating ion packets in the extraction region of a TOF mass analyzer in targeted acquisition

A calibration apparatus for a mass analyzer includes an ion source device and a dual-purpose electron beam generating unit. The ion source device ionizes an analyte of a sample, producing analyte ions. The dual-purpose electron beam generating unit is positioned between the ion source device and the mass analyzer. In a first mode, the dual-purpose electron beam generating unit is used to create fragments of analyte ions of unknown mass-to-charge ratio. In a second mode, the dual-purpose electron beam generating unit is used to create ions of calibration compounds of known mass-to-charge ratio. All ions are subsequently transferred to the mass analyzer.

TOF mass calibration

In one aspect, a curtain and orifice plate assembly for use in a mass spectrometry system is disclosed, which comprises a curtain plate including a first printed circuit board (PCB) having an aperture configured for receiving ions generated by an ion source of the mass spectrometry system and at least one gas-flow channel, where said first PCB has at least one metal coating disposed on at least a portion thereof. The assembly further includes an orifice plate coupled to the curtain plate, which includes a PCB providing an orifice that is substantially aligned with the aperture of the curtain plate so that the ions entering the assembly via said aperture of the curtain plate can exit the assembly via said orifice of the orifice plate, where the second PCB has at least one metal coating disposed on at least a portion thereof.

Integrated low cost curtain plate, orifice PCB and ion lens assembly

A ring stacked accelerator for use in a mass spectrometer includes a plurality of ring shaped plates arranged in a stack and is electrically coupled to a voltage divider that allows a substantially homogeneous electric field to be produced when the stack is energized. The voltage divider can include resistors and capacitors, where the capacitors are chosen to compensate for parasitic capacitances experienced by the plates. The ring stacked accelerator can be energized using an RF pulse. The ring stack accelerator can include one or more balancing capacitors for correcting effects that cause nonlinearity.

Homogenization of the pulsed electric field created in a ring stack ion accelerator

A mass spectrometer and method is provided for a time-of-flight analyzer (TOF) having an accelerator stage with a plurality of electrodes to receive and accelerate a plurality of ions, and a drift chamber downstream of the accelerator stage for receiving at least a portion of the accelerated ions. The TOF analyzer also has a pulser coupled to the accelerator stage for applying one or more voltages to the plurality of electrodes and a controller coupled to the pulser to adjust one or more voltages applied to the electrodes to configure the accelerator stage to receive and accelerate positive and negative ions during different cycles of an ion detection period.

High speed polarity switch time-of-flight spectrometer

A lens pulsing apparatus and method for transferring ions in a mass spectrometry system from an area of high pressure to an area of low pressure which includes a gating apparatus that contains multiple electrostatic lenses. Each of the lenses operates at different voltages. The first lens operates at a predetermined fixed voltage and the second lens operates between two different voltages.

Lens pulsing apparatus and method

Mass spectrometers and related methods of making and using the same are disclosed herein that generally involve positioning a blocking or masking element in the path of an ion beam passing through the mass spectrometer so as to selectively block at least a portion of the ions in the ion beam from entering an accelerator. Mass spectrometers and related methods are also disclosed in which an ion beam passing through the mass spectrometer is deflected or otherwise aimed so as to approach a TOF axis of an accelerator at a non-zero angle.

High resolution time-of-flight mass spectrometer

In some embodiments, a time of flight mass spectrometer can comprise an input orifice for receiving ions, a first ion accelerator stage for accelerating the ions along a first path, at least one ion reflector for receiving said accelerated ions and redirecting said ions along a second path different than the first path, a detector for detecting at least a portion of the ions redirected by said at least one ion reflector, and at least first and second field free drift regions disposed between said first acceleration stage and said detector, wherein said second field free region is disposed in proximity of the detector. In some embodiments, the lengths of the field free drift regions can be selected so as to provide 1st and 2nd order corrections of the time of flight of the ions with respect to variation in their initial positions.

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Toronto, Canada

Robert Haufler