Harris Corporation

Robert Haden

Mark Donald Rahmes

J Harlan Yates

Michael McGonagle

Patricia Brown

Systems () and methods () for efficiently and accurately detecting changes in feature data. The methods generally involve: determining first vectors for first features extracted from a first image using pixel information associated therewith; comparing the first vectors with second vectors defined by spatial feature data; classifying the first features into a plurality of classes based on the results of the vector comparisons; and analyzing the first image to determine if any one of the first features of at least one of the plurality of classes indicates that a relevant change has occurred in relation to an object represented thereby.

Systems and methods for efficiently and accurately detecting changes in spatial feature data

Systems () and methods () for efficient spatial feature data analysis. The methods involve simultaneously generating two or more chip images () using image data defining a first image (); concurrently displaying an array () comprising all or a portion of the chip images in a plug-in window (); and displaying in the plug-in window information relating to an attribute (a, a) of a feature (A) contained in a selected one of the displayed chip images (). The chip images are generated in response to a user selection of a feature (A) contained in at least a portion of the first image displayed in an application window (). Each of the chip images comprises a panned view, a zoomed view, or a panned-and-zoomed view of the first image including one or more features of a user-selected feature class.

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Rockledge, FL, United States of America

Robert Haden