Oracle America, Inc.

Sun Microsystems, Inc.

Robert H Melanson

David K McElfresh

Dan Vacar

Leoncio D Lopez

A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.

Apparatus and method for testing electrical interconnects with switches

A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.

Apparatus and method for testing electrical interconnects

A method for testing a substrate by using a photoemission microscope is provided which includes providing the substrate and applying a reverse bias voltage to the substrate. The method further includes detecting light emissions from a top surface of the substrate and characterizing viability of the substrate from the detection of the light emissions.

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San Diego, CA, United States of America

Robert H Melanson