International Business Machines Corporation

Other

Mechanical Plastics Corp.

Robert H Cadwallader

Thomas Clarke Morrison

Klaus Probst

William A Yager

Michael J Fisher

Brian J Wojszynski

Charles P Coughlin

Thomas J Walsh

Harold D Edmonds

Murlidhar V Kulkarni

Yves Darves-Bornoz

Angelo S Gasparri

Yu-Cheng Lee

Francis A Racine

Robert J Celestino

A rocking horse has two arcuate members or rockers which can held in spaced relation to a supporting surface during a portion of the rocking cycle by stirrups. During this portion, the rockers can move with respect to the stirrups and hence with respect to the supporting surface to take a step forward and/or turn. The horse moves using inertial forces inherent in the rocking motion and/or riding activity.

Steerable walking rocking horse

An open ended cylinder element having a longitudinal axis is positioned parallel to the ground and is configured and adapted to be rotatable around its longitudinal axis. A funnel element is longitudinally positioned within the center of the cylinder in a fixed position, with the cylinder being rotatable therearound and the mouth of the funnel extending upwardly away from the ground. The inner surface of the cylinder is provided with at least one longitudinally aligned cleat, with each cleat being configured as a ledge with a short retaining lip and each cleat is dimensioned relative to objects being aligned thereby. Each cleat is configured and dimensioned to scoop up at least one of the objects introduced to the bottom of the cylinder (relative to the ground) and to securely seat one object thereon and is configured and dimensioned whereby objects not securely longitudinally seated directly on the cleat, fall off the cleat, with rotation of the cylinder, prior to vertical alignment of the cleat with the mouth of the funnel, and wherein each cleat is configured and dimensioned such that with further cylinder rotation, the securely longitudinally seated object falls into said funnel in an appropriate longitudinal alignment and each cleat thereafter rotates with rotation of the cylinder to scoop up additional objects. A divided strip carrier thereafter vertically separates the forward and rearwardly aligned objects and aligns them in a single direction.

Gravity assisted cylinder aligning feeder and element separator

An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first surface disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second surface disposed for lateral movement parallel to the first surface, the second surface further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, pivotal member is disposed for pivotal movement about a pivot point and symmetrically coupled, with a zero tolerance buildup, between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second mating engagement surfaces of the first and second locator arm assemblies, respectively, whereby the workpiece is accurately located on the processing surface between respective first and second mating engagement surfaces as the surfaces are moved towards one another.

Locator actuation method

A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.

Substrate tester location clamping, sensing, and contacting method and

An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first multiple position locator jaw disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second multiple position locator jaw disposed for lateral movement parallel to the first multiple position locator jaw and further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, the pivotal member is disposed for pivotal movement about a pivot point. The pivotal member is symmetrically coupled between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second locator jaws to accurately locate the workpiece on the processing surface between the first and second locator jaws as the locator jaws move towards one another.

Substrate tester method and apparatus having rotatable and infinitely

An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for providing a contact actuation force. The guide plate includes side edges with guide pins (108) extending radially outward from a center of each side edge. The electrical contact pad (114) is mounted and centered upon a top surface of the guide plate (106). The support bridge supports the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis. Lastly, the contact actuation force mechanism provides a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and a substrate being contacted. The substrate (54) is to be clamped between test probes (52) and the contact pad (114).

Substrate tester having shorting pad actuator method and apparatus

Locator actuation apparatus

A bearing construction interposes the coils of one or more coil springs between bearing surfaces. In one embodiment a bearing coil spring is wrapped around a shaft several times. The bearing coil spring may be freely mounted on a more substantial race coil retainer centered on the shaft. In another embodiment toroidal coil springs separated by disc races extend circularly about the shaft. In linear bearing construction, the bearing coils are in planes parallel to the line of shaft movement. Other embodiments of the invention involve disengageable shafts having complementary centering end-faces accommodating misalignment through the yield able action of the bearing spring coils, shafts and housings having non-circular cross-sections, and shafts and housings not having completely complementary surfaces to enable interference fit and positional control.

Linear compensating bearing

A coaxial test probe employs a flexible inner conductor that buckles upon the application of an axial load is housed within a conductive outer sheath. The inner probe includes an insulating spacer which forms a recess applied to the protruding end of the inner conductor, such that buckling occurs within recess. A plurality of adjacent probes are mounted on a test fixture at opposing angles to facilitate automatic interrogation of closely spaced contact pads.

Coaxial probe

A new spectrometer station for semiconductor wafers is provided that permits operation in both the reflective and absorption modes either simultaneously or sequentially while the wafer is in a horizontal position. The wafer is positioned in the station on a movable platform. Positioned under the platform is an infrared detector. An optical system over the platform focuses an interferometer beam at that portion of the wafer positioned right over the detector. It also directs light from the beam reflected off the top surface of the wafer at a second infrared detector. An orientor rotates the wafer on the platform so that movement of the wafer by the orientor and movement of the platform allows any part of the wafer to be examined as a test point by the spectrometer.

Dual mode spectrometer test station

An apparatus for printing a paste pattern on a ceramic green sheet having a loading station, a printing station, a stencil mask at the printing station, a carrier for supporting a green sheet, a means to align a green sheet in a given reference position on the carrier, a means to move the carrier horizontally from the loading station to a position beneath the printing station and vertically to a position to be printed beneath the stencil mask, and back to the loading station in the reverse movement order, extruding means at the printing station to print a pattern of paste material through the stencil mask on the surface of a green sheet.

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Clinton Corners, NY, United States of America

Robert H Cadwallader