Harsco Technologies Corporation

Lucent Technologies Inc.

Robert H Arnold

Steven Moyer

Richard Joseph McPartland

Ross Alan Kohler

Paul Kurt Wheeler

Richard D Bell

A hinge apparatus comprising structure to support a user interface incorporated into the cabinet housing of an electro-mechanical system for improved viewing and interaction with the user interface when the cabinet housing is opened during technician service, while simultaneously not obstructing access to the cabinet interior.

Hinge apparatus

An on-chip processor is used as a controller for burn-in and endurance testing of embedded non-volatile memory. An automated test machine downloads a test program into the non-volatile memory. The downloaded program contains a test program to be run on the non-volatile memory. When the burn-in or endurance test equipment activates the processor, the processor executes the program and performs a test on the non-volatile memory. The same method can be utilized to perform either the burn-in or endurance tests. Only the clock and reset lines are required to operate the test. Since the clock and reset lines are part of the processor's standard inputs, the method performs burn-in and endurance testing of an embedded non-volatile memory without bringing out the memory's address, data and control lines to the package pins of the integrated circuit. Since the clock and reset lines are part of the standard burn-in and endurance test equipment, the method also performs the testing without the use of expensive burn-in or endurance test equipment.

Automated method of burn-in and endurance testing for embedded EEPROM

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Bethlehem, PA, United States of America

Robert H Arnold