International Business Machines Corporation

Robert Edward Shearer

Gary William Maier

Matthew Sean Grady

David V Gangl

David John Iverson

Ulrich Alfons Finkler

Donald Lawrence Wheater

Kevin C Quandt

Kenneth A Lavallee

A method and system for generating memory array bitmaps is disclosed that uses the memory binary address and failing memory data bits collected during test of a chip as input and translates this input directly to physical location in physical design formats which uses memory and a logical to physical server in an electronic computer aided design system.

Creation of memory array bitmaps using logical to physical server

A built-in self-test (BIST) system and method for testing an array of embedded electronic devices, the BIST comprising: a shift register device connected to an output pin of an embedded array of electronic devices being tested and for receiving a failure indication signal at a real-time output pin of the device under test, the shift register generating a unique signature in response to receipt of the failure indication; a device for determining whether the generated unique signature is represented in a table comprising known signature values and corresponding bitmaps of prior determined array defects for that device under test; wherein the need to bitmap the array is avoided when a known failure signature is determined.

System and method to predetermine a bitmap of a self-tested embedded array

A method for determining common failure modes of an integrated circuit device under test is disclosed. In an exemplary embodiment of the invention, a test pattern is applied to a series of inputs of the device under test. A set of output data generated by the device under test is then compared to a set of expected data, with the set of output data being generated by the device under test in response to the test pattern. It is then determined whether the set of output data has passed the test, with the set of output data passing the test if the set of output data matches the set of expected data. If the set of output data has not passed the test, then it is determined whether an output signature corresponding to the set of output data matches a previously stored output signature. Fail data corresponding to the output signature is then stored if the output signature matches a previously stored output signature.

Method and system for determining common failure modes for integrated circuits

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Richmond, VT, United States of America

Robert Edward Shearer