Lexmark International, Inc.

Robert Edward Miller, Jr

George Keith Parish

John Glenn Edelen

Kristi Maggard Rowe

David Golman King

Steven Wayne Bergstedt

Paul W Graf

Test circuits on heater chips for testing a heater circuit having a heater element and a first power device. The test circuit can include a second power device, a test device configured to hold the first power device off and the second power device on for a selected heater circuit when the test device receives a signal to activate the test circuit, and a common test output to transmit a signal indicative of a state of the selected heater circuit. Methods for using the same are also provided.

Heater chip test circuit and methods for using the same

A heater chip for a micro-fluid ejection device having enhanced adhesion between a resistor layer and a protective layer. The heater chip includes a substrate, a resistive layer deposited adjacent to the substrate, and a substantially non-conductive protective layer adjacent to the resistive layer. The protective layer is selected from a titanium-doped diamond-like carbon thin film layer, and a single thin film diamond-like carbon layer having at least a first surface comprised of more than about 30 atom % titanium.

Resistor protective layer for micro-fluid ejection devices

Growing community of inventors

Louisville, KY, United States of America

Robert Edward Miller, Jr