Delphi Technologies, Inc.

Packard Hughes Interconnect Company

Robert Earl Daugherty, Jr

Eric Dean Jensen

Cesar A Mora

A connector backshell assembly configured to interconnect a cable to a connector. The connector backshell assembly has multiple cable portals at exit angles, such as straight, 90 degree, and 45 degree relative to the connector. The connector backshell assembly is separable into two halves to allow easy access to the rear portion of the connector for connecting and servicing the cable/connector interface. Unused cable portals may be sealed with a plug. The connector backshell assembly may be used with various Military specification (Mil Spec) types including M38999, M28840, M28876, M5015, and M64266.

Connector backshell having multiple cable exit configurations

A modular, snap-together clamping system for electrically interconnecting two printed circuit boards using a flexible circuit is provided. The clamping system comprises two inboard clamp members which are configured to cooperate with two generally complimentary outboard clamp members, so as to capture a portion of each of the printed circuit boards along with two end portions of the flexible circuit between the inboard clamp members and the outboard clamp members in a manner which facilitates electrical connection of each of the two printed circuit boards with the flexible circuit. The inboard clamp members are also configured to facilitate attachment of an interchangeable spacer thereto. The spacer is configured to facilitate desired positioning of the two printed circuit boards with respect to one another.

Connecting system for printed circuit boards

A membrane test probe for an integrated circuit has a support frame, an annular substrate fixed to the support frame, and a flexible membrane fixed to and stretched tightly across the annular substrate. The membrane has an intermediate area that includes a plurality of probe contacts on its lower surface that are configured and arranged to be pressed against contact pads of an integrated circuit to be tested. A plurality of conductive traces are connected to the button contacts and configured and arranged for connection to test circuitry. The membrane test probe also includes a support plate for engaging an upper surface of the intermediate area and an adjustment mechanism for leveling the support plate and tensioning the membrane. The adjustment mechanism includes an adjustment ring, a lever ring and a pressure plate frame. The pressure plate frame engages the support plate and urges the same against the intermediate area of the membrane. The lever ring has a plurality of radial levers that push against the pressure plate frame at a plurality of spaced locations, and the support ring has a plurality of individually adjustable plungers deflecting respective radial levers for leveling the support plate and tensioning the membrane.

Growing community of inventors

Irvine, CA, United States of America

Robert Earl Daugherty, Jr