Bae Systems Imaging Solutions Inc.

Bae Systems Information and Electronic Systems Integration Inc.

Robert Daniel McGrath

Dimitre P Dimitrov

Stephen P Tobin

A system is provided for time delay integration in complementary metal oxide semiconductor imaging sensors, the system comprising: a two dimensional parallel charge transfer structure comprising at least one column of CMOS Image sensor pinned photodiodes; each the diode in the column being connected to the next the diode by a two phase transfer gate, each the transfer gate having a barrier and a well configured such that a flow of charge in the column is unidirectional.

Time delay integration structure for complementary metal-oxide semiconductor imaging sensor

A pixel, is provided the pixel comprising: a photodiode structure built on top of an integrated circuit generating a charge; the integrated circuit comprising at least one semiconductor material and at least one interconnect layer; the at least one interconnect layer comprises an interconnect to facilitate charge flowing into a collection node disposed in the semiconductor material; the interconnect being in contact with a doped contact diffusion disposed proximate to the collection node; a transfer transistor disposed between the collection node and a conversion node, the conversion node coupled to an active transistor; the pixel having a reset configured to reset the conversion node.

Low-noise integrated post-processed photodiode

Devices and methods of minimizing the temporal error between pixels or groups of pixels on a focal plane array involving, on a focal plane array comprising at least two pixels or groups of pixels, at least one counter or ramp, and at least one trigger: determining the timing error associated with a time stamp associated with the at least two pixels or groups of pixels; storing the timing error associated with the at least two pixels or groups of pixels and the pixel or pixel group location; and using the stored timing error and pixel or pixel group location to correct subsequent time stamps associated with the at least two pixels or groups of pixels, wherein the timing error corresponds to a systematic error between the trigger and the counter or ramp value due to the location of a pixel or group of pixels on the focal plane array.

Sensor readout with timestamp calibration

A system for low light level image sensing is provided having: A photodiode; a transfer gate disposed in a center of the photodiode; an active gate disposed surrounded by the transfer gate; a plurality of microlenses, each microlens being disposed over a portion of the photodiode and directing light away from the transfer gate towards the photodiode.

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Lexington, MA, United States of America

Robert Daniel McGrath