Ncr Corporation

Lsi Corporation

Lsi Logic Corporation

At&t Global Information Solutions Company

Hyundai Electronics America, Inc.

Symbios Logic Inc.

Robert D Waldron

Donald Thomas McGrath

Kenneth G Richardson

Scott C Savage

Dao-Long Chen

Harold S Crafts

Ranko L Scepanovic

Richard Thomas Schultz

Anatoli Aleksandrovich Bolotov

Mikhail I Grinchuk

Khanh Cong Nguyen

Norman E Mause

Rich Schultz

Larry Greenhouse

A method of storing sensitive data by generating randomization values, transforming the sensitive data and the randomization values into a result, and storing separate portions of the result on at least two storage devices, such that the sensitive data cannot be disclosed if any one of the storage devices is compromised.

Data shredding RAID mode

A method for producing a chip is disclosed. A first step of the method may involve fabricating the chip only up to and including a first metal layer during a first manufacturing phase such that an input/output (I/O) region of the chip has a plurality of slots, where each of the slots has a plurality of first transistors. A second step of the method may involve designing a plurality of upper metal layers above the first metal layer in response to a custom design created after the first fabricating has started, the upper metal layers interconnecting a plurality of the first transistors to form a plurality of mixed-signal building block functions. A third step of the method may involve fabricating the chip to add the upper metal layers during a second manufacturing phase.

Use of configurable mixed-signal building block functions to accomplish custom functions

A system and method for designing a complex electronic circuit by simulating blocks of the circuit using various simulators to produce a net list, designing the physical layout of the circuit using a layout tool that produces a layout verses schematic reference file, mapping the reference file to the net list to create a mapping file, and analyzing the mapping file to verify that the layout meets various criteria. Each block may be verified using simulation tools that are appropriate for that piece of the overall circuit, and using conditions that may maximize the strain on the circuit. The results from the simulations are compared to the physical layout to determine if the physical layout is able to properly conduct the electrical signals.

Interconnect integrity verification

An apparatus comprising an integrated circuit having (i) a number of regions each pre-diffused and configured to be metal-programmed and (ii) a plurality of pins configured to connect the integrated circuit to a socket. A logic portion may be implemented on the integrated circuit (i) configured to implement integrated circuit operations and (ii) having one or more I/O connections and one or more supply connections. A first group of the pre-diffused regions are metal-programmed and coupled to said I/O connections. A second group of the pre-diffused regions are metal-programmed and coupled to the supply connections.

Distributed relocatable voltage regulator

An apparatus including a base layer of a platform application specific integrated circuit (ASIC), a mixed-signal function and a built-in self test (BIST) function. The base layer of the platform ASIC generally includes a plurality of pre-diffused regions disposed around a periphery of the platform ASIC. Each of the pre-diffused regions is generally configured to be metal-programmable. The mixed-signal function may include two or more sub-functions formed with a metal mask set placed over a first number of the plurality of pre-diffused regions. The BIST function may be formed with a metal mask set placed over a second number of the plurality of pre-diffused regions. The BIST function may be configured to test the mixed-signal function and present a digital signal indicating an operating condition of the mixed-signal function.

Relocatable built-in self test (BIST) elements for relocatable mixed-signal elements

A method for producing a chip is disclosed. A first step of the method may include fabricating the chip only up to and including a first metal layer such that a core region of the chip has an array of cells, each of the cells having a plurality of transistors. A second step generally involves designing a plurality of upper metal layers above the first metal layer in response to a custom design created after the first fabricating has started, the upper metal layers interconnecting a plurality of the cells to form (i) a mixed-signal module and (ii) a digital module, the mixed signal module generating at least one analog signal and at least one digital signal. In a third step, the method may include fabricating the chip to add the upper metal layers.

Mixed-signal functions using R-cells

An apparatus that may include a base layer of a platform application specific integrated circuit (ASIC) and a mixed-signal function. The base layer of the platform application specific integrated circuit (ASIC) generally comprises a plurality of pre-diffused regions disposed around a periphery of the platform ASIC. Each of the pre-diffused regions may be configured to be metal-programmable. The mixed-signal function may include two or more sub-functions formed with a metal mask set placed over a number of the plurality of pre-diffused regions.

Relocatable mixed-signal functions

A method for interconnecting sub-functions of metal-mask programmable functions that includes the steps of (A) forming a base layer of a platform application specific integrated circuit (ASIC) comprising a plurality of pre-diffused regions disposed around a periphery of the platform ASIC, (B) forming two or more sub-functions of a function with a metal mask set placed over a number of the plurality of pre-diffused regions of the platform application specific integrated circuit and (C) configuring one or more connection points in each of the two or more sub-functions such that interconnections between the two or more sub-functions are tool routable in a single layer. Each of the pre-diffused regions is configured to be metal-programmable.

Method of interconnect for multi-slot metal-mask programmable relocatable function placed in an I/O region

A method for concentric metal density power distribution is disclosed that reduces metal density and increases available area for routing clock and signal traces. A method of concentric metal density power distribution includes the steps of partitioning an area of standard cells in an integrated circuit chip into a plurality of power regions, forming a power boundary around each of the plurality of power regions, and forming a plurality of concentric straps in a metal layer of the integrated circuit chip wherein each of the plurality of concentric straps has a strap width that varies from a maximum strap width at a periphery of each of the plurality of power regions to a minimum strap width toward a center of each of the plurality of power regions.

Concentric metal density power routing

A single-edge triggered phase detector which provides high speed phase detection. The phase detector works on only a single edge of the clock and data signal, which can be either the rising or falling edge. Extracted control signals are latched for at least one half of a clock period or more to ensure full rail to rail swing.

Single-edge triggered phase detector

A data communication method and apparatus includes an integral bit error rate test system. The system is adapted to receive digital data signals to be transmitted over a communication link and includes a transmitter for transmitting the data signals onto the link. A test signal pattern generator generates a determinable pattern of digital bit test signals which are insertable into an input of the transmitter in place of the digital data signals. A receiver is coupled to the link for receiving the bit test signals and for comparing the received pattern of the bit test signals to the determinable pattern. The bit error rate is computed from the number of bit differences between the transmitted test signals and the determinable pattern.

Integral bit error rate test system for serial data communication links

A charge pump circuit for a phase-locked loop circuit which provides substantially constant charge and discharge currents characterized by minimal overshoots and undershoots. The charge pump circuit includes a level shifter circuit which attenuates voltage swings in Up and Down signals from the phase detector and provides control signals. The charge pump circuit also includes a feedback circuit coupled to the level shifter which compares the output voltage of the charge pump to predetermined first and second reference voltages and increases and decreases the charge and discharge currents to minimize overshoot and undershoot noise as determined by the control signals.

Fast CMOS charge pump circuit

A differential inverter such as may be used in an oscillator circuit. The differential inverter is connected between first and second current sources. The differential inverter includes first and second single signal CMOS inverters connected in parallel between the first and second controlled current sources. Each of the current sources is a MOS transistor. A bias circuit is connected to the control gates of the MOS transistors and provides bias signals thereto, the bias circuit includes a variable current source with bias signals being generated in response to the current flow in the variable current source.

High speed current/voltage controlled ring oscillator circuit

A device and method for approximating the square root of a binary number N. The device includes hardware for storing N, and a result register for storing x.sub.n, where x.sub.n is a successive approximation of r. The device also includes hardware for iteratively replacing x.sub.n with x.sub.n+1, starting with n=0, where x.sub.n+1 =(Ax.sub.n +N-x.sub.n.sup.2)/A, and x.sub.0 is within a predetermined range. 'A' is a multiple of 2 so that an operation involving a product or quotient with 'A' is effected by a shift operation.

Device and method for approximating the square root of a number

A voltage variable delay circuit that provides a relatively constant delay independent of operating voltages, temperatures or processing variations is disclosed. The circuit is particularly suited for delay line or oscillator applications. The relatively constant delay is accomplished by accurately controlling the switching speed of each of the complementary series arranged inverter elements used for the delay line or oscillator. The accurate control is provided by first and second high impedance inverters connected to the gate electrode of series arranged inverters. In the delay line application, two similarly fabricated series arranged inverter elements are placed in parallel. One of the series arranged inverters is used as an operating circuit and the other is used as a reference circuit. A clock signal is used to synchronize the reference circuit with a timing network, and a comparator is used to measure the time difference between the reference circuit and the timing network. The output of the comparator is integrated and used to produce an analog-type control voltage which varies the time delay of both the operating and reference circuits until the reference circuit time delay is equal to that determined by the timing network. Conforming the reference circuit also conforms the operating circuit thereto. In the oscillator application, a synchronizing circuit is also used to produce a variable control voltage that adjusts the oscillator frequency until it is equal to an external measuring synchronizing time base.

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Fort Collins, CO, United States of America

Robert D Waldron