Emc Corporation

Robert D Maiorana

Douglas E Peeke

Brian K Bailey

A system and method of testing processor boards in which a test path is created by setting switches in distribution hubs and the devices under test. Test signals are sent through the test path and errors in the signals are used to identify faulty boards. The distribution hubs of an embodiment can detect, report and eliminate errors in the test signals. A command path from a host to the distribution hubs and devices under test is provided through a multi-terminal connector. The command path is preferably separate from the test path. A test signal generator may be included. The system may be particularly adapted for fiber channel testing.

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Wellesley, MA, United States of America

Robert D Maiorana