International Business Machines Corporation

Robert Christopher Dixon

Thoi Nguyen

Kirk Edward Morrow

Hien Le

Jeffrey A Stuecheli

Louis Bennie Capps, Jr

Charles Francis Marino

Lonny Lambrecht

Tung Nguyen Pham

John Wayne Hartfiel

Alan Grant Singletary

Phil C F Paone

Van Hoa Lee

Michael Wayne Harper

Parag Birmiwal

Khuong Huu Pham

Timothy Michael Lambert

William Paul Hovis

Phillip John Restle

Barry Joe Wolford

Richard Nicholas

Robert Louis Franch

Howard Carl Tanner

Chad J Larson

Tuan Hoang Nguyen

Luis Carlos Medina

Abraham Arevalo

Josefina Santiago Drerup

Hein Minh Le

A request to send a message from a first component, located on a first processor, to a second component, located on a second processor, is received. It is determined that the second processor can be communicated with via a first bidirectional communication path. It is determined that bandwidth is available on the first bidirectional communication path. It is determined that bandwidth is available on a second bidirectional communication path. In response to a determination that bandwidth is available on the second bidirectional communication path, a data path is created between the first component and the second bidirectional communication path and the request to send the message to the second component is granted. In response to a determination that bandwidth is not available on the first bidirectional communication path or on the second bidirectional communication path, the grant of the request to send the message to the second component is delayed.

Intercomponent data communication between different processors

A request to send a first message from a first component to a second component is received at an arbiter. The first component is located in a first time zone and the second component is located in a second time zone. The arbiter determines that the second component is located in the second time zone. It is determined that the second time zone can be communicated with via one or more communications channels in a first direction. It is determined whether bandwidth is available on the one or more communications channels in the first direction. If bandwidth is available on the one or more communications channels in the first direction, a data path between the first component and the one or more communications channels in the first direction is created and the request is granted. Otherwise, the grant of the request is delayed.

Intercomponent data communication

Intercomponent data communication between multiple time zones

The present invention provides for a system. The system includes a plurality of controllers, each controller comprising at least an output pin and a plurality of input pins and configured to receive self-identify control signals through one or more of the plurality of input pins and to transmit a controller self-identify signal through the output pin based on the self-identify control signals. Each output pin is coupled to an external system. A processor couples to a first input pin of the plurality of input pins of each of the plurality of controllers and is configured to generate self-identify control signals and to transmit the self-identify control signals to the plurality of controllers.

Multi-chip digital system having a plurality of controllers with self-identifying signal

A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock edges, which are filtered to identify a single location for each edge. Imbalance in space between the edges indicated imbalance in duty cycle. Up/down signals are generated from any imbalance and passed to a phase locked loop to adjust the balance.

Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle

Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the electronic component design into electronic test equipment employed during validation testing of the actual electronic component. The method includes: storing simulation data resulting from simulation testing of an electronic component's design; employing electronic test equipment to perform real-time testing of the actual electronic component and obtain real-time test signals therefor; automatically correlating the stored simulation data with the actual real-time test signals; and performing at least one of overlaying and/or displaying the correlated simulation data as virtual signals with the real-time test signals; and employing a trigger event automatically ascertained from the stored simulation data and triggering the electronic test equipment based thereon, thereby automatically controlling real-time testing of the electronic component via the stored simulation data.

Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component

Securing an integrated circuit, including fabricating the integrated circuit to include a multiplicity of unblown efuses, at least one surrogate efuse that emulates a blown efuse, non-volatile data representing the blown state of the surrogate efuse, and security circuitry; and setting, by the security circuitry when power is first applied to the integrated circuit, a security state of the integrated circuit in dependence upon whether a sensed state of the surrogate efuse is equal to the blown state of the surrogate efuse.

Securing an integrated circuit

A virtual electronic fuse apparatus and methodology are disclosed that permit the state of an electronic fuse to change from an un-blown state to a blown state and then back to a virtual un-blown state. In one embodiment, the electronic fuse may change from the virtual un-blown state back to a virtual blown state.

Virtual electronic fuse apparatus and methodology

A method for improved Logic Built-In Self-Test (LBIST) includes providing a plurality of control signal sets, by an LBIST controller, to an LBIST domain comprising a plurality of LBIST satellite modules. Each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves the LBIST channel scan and LBIST sequence operations for each of the LBIST satellite modules, through the plurality of control signal sets. A test system includes a Logic Built-In Self-Test (LBIST) domain comprising a plurality of LBIST satellite modules. An LBIST controller couples to the LBIST domain and provides a plurality of control signal sets to the LBIST domain, wherein each of the plurality of LBIST satellite modules receives an individual one of the plurality of control signal sets. The LBIST controller interleaves LBIST channel scan operations for each of the LBIST satellite modules, through the plurality of control signal sets.

System and method for improved LBIST power and run time

Exemplary methods, apparatuses, and products are described for creating a behavioral model of a hardware device for use in a simulation environment. The behavioral model is created by an iterative process that includes receiving in a simulated hardware device from a simulated device under test ('DUT') a stimulus waveform. The stimulus waveform includes data representing a number of stimuli. In response to receiving the stimulus waveform, the simulated hardware device presents a recorded response waveform from a recorded response file to the DUT. The stimulus waveform is also recorded. The recorded stimulus waveform is presented to the hardware device. A response waveform that results from presenting the recorded stimulus waveform to the hardware device is recorded in the recorded response file.

Creating a behavioral model of a hardware device for use in a simulation environment

A virtual electronic fuse (VEF) apparatus and methodology are disclosed that permit the state of an electronic fuse to change from an un-blown state to a blown state and then back to a virtual un-blown state. In one embodiment, the electronic fuse may change from the virtual un-blown state back again to a virtual blown state. The fuse apparatus includes multiple VEFs, each VEF exhibiting a respective address. The fuse apparatus also includes an address pool including multiple address pool locations. A fuse programmer stores an address of one of the VEFs in one or more address pool locations to indicate one or more state changes for a particular VEF. The fuse programmer may also store different VEF addresses in different address pool locations to indicate state changes for different VEFs.

Electronic fuse apparatus and methodology including addressable virtual electronic fuses

Securing an integrated circuit, including fabricating the integrated circuit so that the integrated circuit includes at least one efuse that is intended to be always blown during operation of the integrated circuit and the integrated circuit includes security circuitry capable of blowing the efuse and of performing other security related functions; blowing, by the security circuitry of the integrated circuit, the efuse when power is applied to the integrated circuit and prior to performing any other security related functions; and setting, by the security circuitry after blowing the efuse, a security state of the integrated circuit in dependence upon a sensed state of the efuse.

Electronic component validation testing is facilitated by a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of the electronic component design into electronic test equipment employed during validation testing of the actual electronic component. The method includes: storing simulation data resulting from simulation testing of an electronic component's design; employing electronic test equipment to perform real-time testing of the actual electronic component and obtain real-time test signals therefor; automatically correlating the stored simulation data with the actual real-time test signals; and performing at least one of: overlaying and/or displaying the correlated simulation data as virtual signals with the real-time test signals; and employing a trigger event automatically ascertained from the stored simulation data and triggering the electronic test equipment based thereon, thereby automatically controlling real-time testing of the electronic component via the stored simulation data.

The present invention provides for a system, comprising a controller and a processor. The controller comprises at least an output pin and a plurality of input pins, and is configured to receive self-identify control signals through one or more of the plurality of input pins and to transmit a controller self-identify signal through the output pin based on the self-identify control signals. The processor is coupled to the controller and configured to generate self-identify control signals and to transmit the self-identify control signals to the controller.

Growing community of inventors

Austin, TX, United States of America

Robert Christopher Dixon