Advanced Micro Devices Corporation

Robert C Thaden

Gopi Ganapathy

Thang M Tran

Eric W Mahurin

Brian D McMinn

Michael D Goddard

Thomas W Lynch

Robert M Perlman

Steven C Hesley

Prem Sobel

Glenn A Tamura

Jeffery E Short

Raju Vesgesna

Christopher B Ang

Steve Horne

A method for designing integrated circuits may include custom designing, at the transistor level, individual cells to be incorporated into cell-based macros. A macro-level function of an integrated circuit's design specification requiring custom, transistor-level design may be identified and custom cells may be designed at the transistor-level to meet the design specification. Custom designed cells may be included in cell-based macros, thus allowing cell-based simulation and verification methodologies and tools to be used on the integrated circuit design. Static timing analysis, circuit extraction and other characteristics may be defined for each custom cell and the timing analysis and circuit extraction for cell-based macros may be defined based on the timing and extraction information for the custom cells included in the macro.

Integrated circuit design with cell-based macros

An latch circuit includes an input line receiving electrical signals from a bus, a latch for conducting electrical signals from the precharged bus to a receiving circuit, and a structure for enabling the latch only when data is driven onto the bus.

Circuit for delaying data latching from a precharged bus and method

A test circuit and test technique for scan testing integrated circuits is disclosed. The test circuit includes a drive 1 or drive 0 scan element which utilizes fewer transistors than conventional scan latches. The testing technique utilizes the clock input to the latches in the ICs for propagating data through the latches. The test circuit and test techniques may be used with microprocessors and particularly RISC microprocessors. The test technique includes coupling a drive 1 or drive 0 element to a logic element coupled to a general latch. The drive 1 or drive 0 scan element allows the general latch to be clocked by a clock signal such as a .phi.1 clock signal or .phi.2 clock signal.

Full scan optimization technique using drive one/drive zero elements and

A floating point processor for pipelining a series of calculations of simple and compound arithmetic operations includes at least one arithmetic operation unit for performing arithmetic operations on input operands provided to the arithmetic operation units and at least one accumulator for storing the results of the arithmetic operations performed by the arithmetic operation unit. The results stored in the accumulators are then provided to the arithmetic operation units. Arithmetic operations are pipelined through the floating point processor by a series of latches which sequence the input operands, results produced by the arithmetic operation units using the input operands, and results produced by the arithmetic operation units using the input operands and the accumulated operands.

Pipelined floating point processing unit

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Austin, TX, United States of America

Robert C Thaden