Hewlett-packard Company

Robert C Illick, Jr

David T Crook

Kamran Firooz

Vance R Harwood

An improved digital testing device is presented which includes the capability to detect and avoid a pair of common sources of measurement error. One source of error occurs when measurements are made within a Setup time before a transition in the signal under test or during a Hold time after such a transition. This device includes the ability to detect when this occurs and to insert a relative delay between the measurements and transitions to eliminate such errors. The device also detects the existence of a 3-state condition of a point of the circuit under test during the period of a measurement and provides an output indication when such occurs.

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Loveland, CO, United States of America

Robert C Illick, Jr