Carl Zeiss Jena Gmbh

Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Carl Zeiss Microimaging Gmbh

Carl Zeiss Microelectric Systems Gmbh

Ernst-abbe-hochschule Jena

Robert Brunner

Ralf Wolleschensky

Hans-Juergen Dobschal

Michael Haisch

Thomas Scheruebl

Joachim P Spatz

Hans-Jürgen Dobschal

Othmar Marti

Joern Greif-Wuestenbecker

Norbert Rosenkranz

Christoph Morhard

Thomas Stifter

Christian Williges

Matthias Kraus

Ulrich Naegele

Jan-Henning Dirks

Wenwen Chen

The invention provides a method for increasing the order of an array of polymeric micelles or of nanoparticles on a substrate surface comprising a) providing an ordered array of micelles or nanoparticles coated with a polymer shell on a substrate surface and b) annealing the array of micelles or nanoparticles by ultrasonication in a liquid medium which is selected from the group comprising HO, a polar organic solvent and a mixture of HO and a polar organic solvent. In a related aspect, the invention provides the highly ordered arrays of micelles or nanoparticles obtainable by the methods of the invention.

Highly ordered arrays of micelles or nanoparticles on a substrate surface and methods for producing the same

In a microscope comprising an objective and an eyepiece, which displays images of an object sensed by the objective, as well as comprising a camera which records the images of the object sensed by the objective, an eyepiece is provided which senses an image generated by a display, said display displaying the image recorded by the camera.

Stereomicroscope with coupling unit to swivel objective upon sensing movement of eyepiece

A microscope objective system including an objective, which includes an illumination beam path via which illumination radiation from a source is directed onto an object to be examined, as well as a partial detection beam path surrounding at least part of the illumination beam path and, together with the illumination beam path, forms a detection beam path via which radiation to be detected and coming from the sample is guided towards a detector.

Microscope objective system

Imaging system for a microscope based on extreme ultraviolet (EUV) radiation. The present invention is directed to a reflective imaging system for an x-ray microscope for examining and object in an object plane, wherein the object is illuminated by rays of a wavelength of less than 100 nm, particularly less than 30 nm, and is imaged in a magnified manner in an image plane. In the imaging system, according to the invention, for a microscope based on extreme ultraviolet (EUV) radiation with wavelengths in the range of less than 100 nm, with a magnification of 0.1&#xd7; to 1000&#xd7; and a structural length of less than 5 m, at least one of the imaging optical elementsandin the beam path has a diffractive-reflective structure which is arranged on a spherical or plane area and has a non-rotationally symmetric, asymmetric shape. The arrangement according to the invention provides an imaging system which avoids the disadvantages of the prior art and ensures a high imaging quality. The manufacturing cost remains reasonable due to the exclusive use of spherical mirrors.

Imaging system for an extreme ultraviolet (EUV) beam-based microscope

A method for determining the distance of a scanning probe of a scanning probe microscope from a specimen surface to be examined comprising the steps of: exciting the scanning probe to oscillations lateral to a surface to be examined; recording at least one amplitude signal and a frequency signal and a phase signal of the oscillating scanning probe; superimposing a vertically oscillating movement of the scanning probe and specimen surface to be examined relative to one another is superimposed on the oscillation of the scanning probe lateral to the specimen surface to be examined; and determining the distance of the scanning probe from the specimen surface from at least one of the amplitude signal and a frequency signal and a phase signal.

Method for determining the distance of a near-field probe from a specimen surface to be examined, and near-field microscope

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Jena, Germany

Robert Brunner