Exfo Inc.

Leddartech Inc.

Other

Robert Baribault

Pierre Olivier

Mario L'Heureux

Nicolas Caron

Vincent Racine

Stephane Perron

Bernard Ruchet

Daniel Gariepy

Olivier Cote

Denis Lafrance

Etienne Morin-Drouin

Léo Gagné

Guillaume Lavallee

Eric Dorion

Samuel Magny

Methods and systems for wide-angle LiDAR are provided that utilize magnification optics that provide non-uniform resolution in different areas of a Field of View (FoV).

Systems and methods for wide-angle LiDAR using non-uniform magnification optics

There is therefore provided a method, system and computer program for detecting duplicate optical-fiber connector endface inspections performed on a same optical-fiber connector. Duplicate optical-fiber connector endface inspections can be detected by extracting a signature of the optical-fiber connector endface from the acquired optical-fiber connector endface inspection image to uniquely identify the optical-fiber connector and detect duplicate optical-fiber connector endface inspections. The signature can be stored to help detection of inadvertent or fraudulent duplicate or repetitive measurements made on a same optical-fiber connector.

Signature recognition on optical-fiber connector endfaces

There are provided an optical-fiber connector endface inspection microscope system and a method for inspecting an endface of an optical-fiber connector. The inspection microscope device is releasably connectable to an adapter tip configured to interface with the optical-fiber connector to inspect the endface thereof. The adapter tip is one among a plurality of adapter tip types adapted to inspect respective types of optical-fiber connectors. The optical-fiber connector endface inspection microscope system comprises a tip detection system adapted to recognize the type of the adapter tip among the plurality of adapter tip types; and is configured to analyze inspection images to produce an inspection result for the endface, at least partly based on a fiber type corresponding to the recognized adapter tip and/or other information read by the tip detection system.

Optical fiber endface inspection microscope having adapter tip detection and autoconfiguration

Methods and systems for combining information from a first image captured of a scene via a first sensor and information from a second image captured of the scene via a second sensor wherein the first image and second image have at least one common field of view (FoV) and wherein the first image comprises pixels that are distributed according to a non-linear image point distribution function. The first image is corrected, before combining, based on said non-linear distribution function.

A LIDAR apparatus for scanning a scene is provided that includes a transmitter stage, a receiver stage, a beam-steering engine configured to steer the light beam received from the transmitter stage in different directions to scan at least a portion of the scene. The beam-steering engine is responsive to steering commands to produce corresponding deflections of the light beam.

Beam-steering devices and methods for LIDAR applications

There is provided an optical-fiber connector endface inspection microscope system comprising optical power measurement capability, wherein optical power measurement is provided via an optical power meter device implemented within an extension unit positioned along an optical path between the inspected optical-fiber connector endface and the optical-fiber connector endface inspection microscope, i.e. between the inspected optical-fiber connector endface and objective optics of the optical-fiber connector endface inspection microscope.

Optical fiber endface inspection with optical power measurement

There is provided a method, system and image capture device for determining a polarity of a multi-fiber cable link comprising a plurality of optical fiber links each connected between a first multi-fiber connector and a second multi-fiber connector, according to said polarity. Test light is injected into one or more of the optical fiber links via corresponding injection ports of the first multi-fiber connector, in accordance with a defined injection pattern; at least one polarity-testing image of the second multi-fiber connector is generated in which test light exiting at least one of the optical fiber links through one or more exit ports of the second multi-fiber connector is imaged as one or more spotlight spots in the polarity-testing image; and the polarity of the multi-fiber cable link is determined based on a pattern of said one or more spotlight spots in said polarity-testing image.

Method and system for multi-fiber cable testing

Display screen, or portion thereof, with graphical user interface for multi-fiber connector, fiber inspection probe testing

An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.

Multiple-fiber connector inspection

The fiber inspection microscope and power measurement system for inspecting an endface of an optical fiber at an angle-polished connector generally has: a mating interface for receiving the angle-polished connector, the endface causing a mean propagation direction of light exiting the optical fiber at endface to be tilted relative to an imaging path of the system; a converging element to be optically coupled to the endface and being configured to receive the tilted light and to redirect the tilted light toward the imaging path of the fiber inspection microscope system; and a power detection assembly optically coupled to the converging element, the power detection assembly being configured to detect an optical power associated with the tilted light redirected by the converging element.

Fiber inspection microscope and power measurement system, fiber inspection tip and method using same

There is provided an adapter tip to be employed with an optical-fiber inspection microscope probe and an optical-fiber inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip or microscope system comprises a relay lens system having at least a first relay lens which is disposed so as to directly receive light reflected from the optical-fiber endface during inspection, the lens axis of the first relay lens being offset relative to the optical-fiber endface so as to deviate light reflected from the optical-fiber endface towards the optical-fiber axis of the connector.

Adapter tip and microscope system for inspection of fiber-optic connector endface

A fiber inspection system for inspecting optical-fiber endfaces of a multiple-fiber connector is provided that includes a housing structure, a mating interface fixed relative to the housing structure for interfacing with the multiple-fiber connector, and an imaging assembly. The imaging assembly is enclosed in the housing structure and defines an inspection plane and an image plane, at least a plurality of the optical-fiber endfaces being disposed on the inspection plane, to within a focusing range, when the multiple-fiber connector is mated to the mating interface. The imaging assembly also defines an imaging axis between an inspection point on the inspection plane and a detection point on the image plane, and includes an alignment module disposed between the inspection plane and the image plane and controllable to move the inspection point across the inspection plane for selectively inspecting one or more of the optical-fiber endfaces.

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CA

Robert Baribault