Perkinelmer Singapore Pte Limited

The Perkin-elmer Corporation

Perkinelmer International C.v.

Perkinelmer Health Sciences, Inc.

Perkinelmer Las, Inc.

Perkinelmer Instruments LLC

(singapore) Pte. Ltd.

Wellesley International C.v.

Robert Alan Hoult

Ralph Lance Carter

Antonio Canas Wilkinson

Paul Styles

David H Tracy

Alan M Ganz

Andrew James Turner

Paul Alexander Evetts

Steve Morris Bush

Ben Perston

Yongdong Wang

Jerry E Cahill

Patrick Courtney

Andrew J Turner

Alistair Fitch

Shab Ladha

David A Huppler

Peter Higham

Colin Blackmore

Douglas W Sharp

Dave Gosbee

George Robert Sealy

Ian Alcock

Dionisis Korontzis

Michael D Forster

Richard Bruce Cassel

Steve Bush

Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving locationfor receiving a samplefor analysis; an illumination arrangementfor directing light towards a received sample; a detectorfor detecting light reflected by a received sample; and collection opticsfor directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometerand a half beam blockwhich is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam blockmay be disposed in the optical path between the interferometer and the light sourcefor blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam blockmay be disposed in the optical path on the opposite side of the interferometer than the light source.

Diffuse reflectance infrared fourier transform spectroscopy

A method for identifying the presence of at least one adulterant substance in a sample. The method comprises receiving sets of sample spectral data, reference spectral data, validation spectral data each set for a respective validation example, and adulterant substance spectral data for said at least one adulterant substance. From these residue data which is representative of a residue which would remain after performing a least squares fitting process between the sample spectral data and the reference spectral data is determined and modified sample residue data which is representative of a residue which would remain after performing a least squares fitting process between the sample spectral data, the reference spectral data and the adulterant substance spectral data is determined. The corresponding two residue data sets are also determined for each validation example. The method then includes performing least one comparison amongst the sample residue data, the modified sample residue data, the validation residue data, and the modified validation residue data; and determining a likelihood value for the presence of said at least one adulterant substance in said sample in dependence on said at least one comparison; and outputting said likelihood value.

Identifying presence of substrates

Diffuse reflectance spectroscopy apparatus for use in analyzing a sample comprising a sample receiving locationfor receiving a samplefor analysis; an illumination arrangementfor directing light towards a received sample; a detectorfor detecting light reflected by a received sample; and collection opticsfor directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometerand a half beam blockwhich is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam blockmay be disposed in the optical path between the interferometer and the light sourcefor blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam blockmay be disposed in the optical path on the opposite side of the interferometer than the light source.

Diffuse reflectance infrared Fourier transform spectroscopy

A method for identifying the presence of at least one adulterant substance in a sample. The method comprises receiving sets of sample spectral data, reference spectral data, validation spectral data each set for a respective validation example, and adulterant substance spectral data for said at least one adulterant substance. From these residue data which is representative of a residue which would remain after performing a least squares fitting process between the sample spectral data and the reference spectral data is determined and modified sample residue data which is representative of a residue which would remain after performing a least squares fitting process between the sample spectral data, the reference spectral data and the adulterant substance spectral data is determined. The corresponding two residue data sets are also determined for each validation example. The method then includes performing at least one comparison amongst the sample residue data, the modified sample residue data, the validation residue data, and the modified validation residue data; and determining a likelihood value for the presence of said at least one adulterant substance in said sample in dependence on said at least one comparison; and outputting said likelihood value.

Identifying presence of substances

A method of using a spectrometer to produce corrected diamond Attenuated Total Reflectance (ATR) spectral data includes acquiring, using the spectrometer, an initial set of ATR spectral data for a sample pressed into contact with a diamond ATR crystals; numerically matching, using the spectrometer, a pressure dependent diamond artifact reference spectrum to a corresponding pressure dependent diamond artifact in the initial set of ATR spectral data; and numerically subtracting out the numerically matched pressure dependent diamond artifact reference spectrum from the initial set of ATR spectral data to yield a corrected set of ATR spectral data for the sample for output by the spectrometer.

Diamond ATR artefact correction

Diffuse reflectance spectroscopy apparatus for use in analyzing a sample comprising a sample receiving location () for receiving a sample () for analysis; an illumination arrangement () for directing light towards a received sample; a detector () for detecting light reflected by a received sample; and collection optics () for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer () and a half beam block () which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from reentering the interferometer. A half beam block () may be disposed in the optical path between the interferometer and the light source () for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block () may be disposed in the optical path on the opposite side of the interferometer than the light source.

A spectroscopic instrument comprising a compartment () for housing instrument components () and desiccant () to protect the instrument components, and a deformable container () having at least one wall portion which is movable within the compartment () so as to vary the volume of the compartment () that is occupied by the deformable container as the container is deformed. The interior of the deformable container () is in fluid communication with the surroundings of the instrument, such that a difference in pressure between the compartment and the surroundings tends to cause the deformable container to deform, moving the wall portion.

Spectroscopic instrument

A spectroscopic instrument () comprising at least one load bearing anti-vibration foot portion () for supporting the instrument on a surface. Each foot portion () comprises a load bearing elastomeric portion () and an internal stub portion () which is provided within the elastomeric portion and which is rigid compared to the elastomeric portion. An internal wall of the elastomeric portion () is spaced from an external wall of the stub portion () such that the elastomeric portion () is moveable relative to the stub portion () to absorb vibration. Liquid is provided in the spacing between the internal wall of the elastomeric portion () and the external wall of the stub portion () to damp such movement.

Spectroscopic instruments and foot portions for spectroscopic instruments

Certain embodiments herein are directed to a differential scanning calorimeter comprising a sample holder thermally coupled to a first furnace, a reference holder thermally coupled to a second furnace, and a processor electrically coupled to the first furnace and the second furnace, the processor configured to receive data during a scan of a sample to provide a heat flow trace and further configured to subtract a calculated baseline from the heat flow trace, the calculated baseline comprising the sum of an isothermal baseline function, a scanning baseline function and a transient baseline function. Calibration methods are also described.

Differential scanning calorimetry and calibration methods for use therewith

Systems and methods for attenuated total reflectance (ATR) spectroscopy. The systems and methods may generally involve differentiating an acquired image in a spectral domain, restricting a spectral range of the acquired image, subtracting an average absorbance from the restricted image data, and applying a principal component analysis to extract significant spectral features from the restricted image data.

Systems and methods for attenuated total internal reflectance (ATR) spectroscopy

An accessory for use with a microscope arranged to carry out ATR measurements has a support () which can be mounted on the moveable stage () of the microscope. A mounting () for an ATR crystal is carried on the support. The mounting () is preferably pivotally mounted on the support () so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample carried on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.

Accessory for attenuated total internal reflectance (ATR) spectroscopy

An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.

Measurement of sample reflectance

An assembly () and a method are provided for inputting a light beam into a light path extending from the confocal scanning head () to the microscope () of a scanning confocal microscope system to illuminate a selected region of a sample mounted in the microscope. The assembly comprises a light input for receiving a light beam from a light source; beam directing means () for controlling the path of the light beam with reference to the shape of the selected region of the sample; and a beam coupler () for selective coupling the light beam into the light path from the confocal scanning head () to the microscope (), with the beam direction being controlled by the beam directing means so as to illuminate the selected region. A scanning confocal microscope system including such an assembly is also described, together with a method of calibrating the system. In addition, an optical switch for selectively switching a light beam between two paths is disclosed.

Relating to scanning confocal microscopy

An accessory for use with a microscope arranged to carry out ATR measurements has a support () which can be mounted on the moveable stage of the microscope. A mounting () for an ATR crystal () is carried on the support. A sample supporting member () is disposed below the location of the ATR crystal. The sample supporting member () has a relatively thin upper wall (). A pressure applying mechanism () is located below the wall () and is operable to apply pressure to a sample through the wall () to ensure good contact between a sample and the sample contacting surface of the crystal.

An accessory for use with a microscope arranged to carry out ATR measurements has a support () which can be fixed to the moveable stage () of the microscope. A mounting member () is carried by the support (). A sample supporting member () is disposed below the location of the ATR crystal (). The sample supporting member () is carried on the support () such that it can be moved to restricted extent relative to the support and defines a sub-stage which can be moved relative to the main stage () of the microscope.

Growing community of inventors

Beaconsfield, United Kingdom

Robert Alan Hoult