Raytheon Company

Ro S Ko

Paul T Hartin

Thomas T Leise

Edward Escandon

An electrical signal delay calibration system includes a device under test (DUT) and a digital signal processing chip including a plurality of signal lanes. Each signal lane includes a receive signal path in signal communication with a respective DUT receive path and a transmit signal path in signal communication with a respective DUT transmit path. A processor is configured to determine transmit pulse timestamps assigned to transmit signals transmitted on the transmit signal paths and to determine receive pulse timestamps assigned to receive signals received from the receive signal paths. The processor determines a lane asymmetry associated with each signal lane based on at least one of the transmit pulse timestamps and at least one of the receive pulse timestamps, and removes each of the lane asymmetries to minimize a signal delay in each signal lane among the plurality of signal lanes.

Growing community of inventors

McKinney, TX, United States of America

Ro S Ko