Hitachi, Ltd.

Other

Hitachi-High-Technologies Corporation

Hitachi High-Tech Electronics Engineering Co., Ltd.

Ritsurou Orihashi

Masayoshi Takahashi

Masami Makuuchi

Norio Chujo

Yoshihiko Hayashi

Shinji Homma

Takahiro Jingu

Wen Zheng Li

Kengo Imagawa

Kenichi Shinbo

Fujio Oonishi

Masashi Fukuzaki

Nobuo Motoki

The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.

Contamination-inspecting apparatus and detection circuit

A pulse generation circuit including a pulse formation circuit for generating normal and dummy pulses according to second delay value data, a data calculation circuit for calculating first delay value data at a timing at which the pulses are generated from the pulse formation circuit according to pattern data having information for determining whether to generate pulses from the pulse formation circuit, a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting the no-pulse-generation cycle from the first delay value data, and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit.

Pulse generation circuit and semiconductor tester that uses the pulse generation circuit

A testing apparatus of a magnetic recording medium for conducting a test on the magnetic recording medium by using reproduced data obtained through reproduction of the magnetic medium, including a plurality of conversion means for converting the reproduced data into digital data, holding means for holding the digital data converted by the plurality of conversion means, data processing means for performing a calculation process on the digital data held by the holding means in relation to a magnetic characteristic of the magnetic recording medium, and analysis processing means for performing an analysis to determine whether or not information obtained by the data processing means satisfies a certain condition.

TESTING APPARATUS FOR CONDUCTING A TEST ON A MAGNETIC RECORDING MEDIUM OR A MAGNETIC HEAD, THROUGH RECORDING TEST DATA ON THE MAGNETIC RECORDING MEDIUM AND REPRODUCING RECORDED TEST DATA THEREFROM BY MEANS OF THE MAGNETIC HEAD

Testing apparatus of magnetic recording medium or magnetic head including a plurality of analog-to-digital converters which convert reproduced testing data into digital data

Growing community of inventors

Tokyo, Japan

Ritsurou Orihashi