Yokogawa Electric Corporation

Risa Hara

Kodai Murayama

Toshiyuki Saruya

Fumie Watanabe

A permeation estimation apparatus includes an interface configured to connect to a sensor that measures a concentration of a component, of a soaked material, that is eluted in a soaking solution in which the soaked material is soaking, and a controller configured to acquire the concentration of the component from the interface and estimate the degree of permeation of the soaking solution with respect to the soaked material based on the measurement result of the concentration of the component.

Permeation estimation apparatus and permeation estimation method

A spectroscopic analysis device () according to the present disclosure includes a controller () that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L) irradiated by an irradiator () with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

Spectroscopic analysis device and spectroscopic analysis method

A spectroscopic analysis device includes: a film that contacts a sample subject to spectroscopic analysis; a first irradiator that irradiates a first irradiation light having transition energy to decompose attached material attached to a boundary surface of the film; and an optical waveguide that transmits the first irradiation light irradiated from the first irradiator. A first evanescent wave, based on the first irradiation light, is generated on a front surface of the optical waveguide, and is then projected on an attached region of the attached material.

Spectroscopic analysis device, optical system, and method

A spectroscopic analysis device includes a detector and a processor. The detector detects measurement light obtained by irradiating, with irradiation light, a sample that contains a contained substance disposed on a film on which surface plasmons are generated. The measurement light includes information on an optical spectrum of the sample, and the information includes a resonance spectrum of the surface plasmons and an absorption spectrum of the sample. The processor calculates: a peak wavelength in a wavelength band in which the resonance spectrum and the absorption spectrum are generated; a peak absorbance of the contained substance based on an absorption band of the contained substance; and a ratio of the contained substance to the sample based on the peak wavelength and the peak absorbance.

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Tokyo, Japan

Risa Hara