Fujifilm Business Innovation Corp.

Rina Takeuchi

Daigo Hama

Kiyotaka Tsuchibuchi

An inspection device includes a processor configured to acquire image information of each of a correct image and a target image as an inspection target, extract edge information of each of the correct image and the target image by using the acquired image information, obtain a difference image between the correct image and the target image, and change a threshold value for detecting a defect by using brightness information or color information of the correct image along with the edge information and detect a defect of the target image by using the difference image and the threshold value.

Inspection device, image forming apparatus, and non-transitory computer readable medium storing inspection program

An inspection device includes a processor configured to acquire image information of each of a correct image and a target image as an inspection target, divide each of the correct image and the target image into blocks and perform alignment for each of the blocks by using the acquired image information, and set a region including a movement amount of the alignment as a block and detect a defect by collating the correct image and the target image for each block.

Growing community of inventors

Kanagawa, Japan

Rina Takeuchi