Sandisk Technologies Inc.

Intelligent Intellectual Property Holdings 2 LLC

Rick Lucky

Jea Hyun

Robert Barry Wood

Hairong Sun

Ryan Haynes

Charla Mosier

John Strasser

James G Peterson

Joshua Perschon

Apparatuses, systems, methods, and computer program products are disclosed for model based configuration parameter management. An association module is configured to group a plurality of erase blocks of a non-volatile memory medium based on an amount of time since data has been written to the plurality of erase blocks. A read module is configured to sample data of at least two word lines from at least one erase block from each of a plurality of groups of erase blocks. A configuration parameter module is configured to determine different read voltage thresholds for different word lines of groups of erase blocks using different read voltage threshold models for different groups based on sampled data.

Model based configuration parameter management

Apparatuses, systems, methods, and computer program products are disclosed for reduced level cell solid-state storage. A method includes determining that an erase block of a non-volatile storage device is to operate in a reduced level cell (RLC) mode. The non-volatile storage device may be configured to store at least three bits of data per storage cell. A method includes instructing the non-volatile storage device to program first and second pages of the erase block with data. A method includes instructing the non-volatile storage device to program a third page of the erase block with a predefined data pattern. Programming of a predefined data pattern may be configured to adjust which abodes of the erase block are available to represent stored user data values.

Reduced level cell mode for non-volatile memory

Apparatuses, systems, methods, and computer program products are disclosed for detecting voltage threshold drift. A method includes programming a predetermined pattern to one page of at least three pages of a set of memory cells. A pattern may have a configuration to reduce a number of bit transitions between abodes of a set of memory cells based on a coding scheme for the set of memory cells. A method includes reading data from a different page of at least three pages. A method includes determining a direction for adjusting a read voltage threshold for a set of memory cells based on read data.

Detecting voltage threshold drift

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Louisville, CO, United States of America

Rick Lucky