Advanced Micro Devices Corporation

Richard Yu-Kuwan Su

Zhi-Yuan Wu

Oiang Chen

According to one exemplary embodiment, a method for determining a self-heating free drain current in a transistor corresponding to a channel temperature not affected by a drain DC current includes measuring at least three unique drain currents of a transistor corresponding to at least three unique ambient temperatures. The method further includes determining at least three unique channel temperatures of the transistor corresponding to the at least three unique drain currents, thereby establishing a current-temperature relationship for the transistor. The method further includes determining the self-heating free drain current of the transistor utilizing the current-temperature relationship.

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Berkeley, CA, United States of America

Richard Yu-Kuwan Su