Apple Inc.

Richard W Lim

Giovanni Gozzini

Benjamin B Lyon

Peter G Panagas

Srdjan D Sobajic

A system for testing a first layer disposed over a capacitive sensing device includes a test probe having a substantially flat conductive test surface, a device under test (DUT) disposed over the capacitive sensing device, and a power supply operatively connected to the test probe. The DUT can include the first layer and one or more additional layers. The substantially flat conductive test surface is positioned over a surface of the DUT and applies power to the DUT. The capacitance between the test probe and at least one capacitive sensing element in the capacitive sensing device is then measured.

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Cupertino, CA, United States of America

Richard W Lim