Harris Corporation

Richard W Belcher

Jack H Linn

Gregory A Schrantz

Elijah Karpov

A multilayer microtip probe, and method of manufacture, having a microtip prepared for adhesion of a first overlayer for determining probe operating properties and a hardened protective overlayer for improving resistance to erosion and wear during probe use.

Multilayer microtip probe and method

Semiconductor device and circuits and methods of fabrication which provides multilevel interconnections with grown diamond insulation films and second level resistors in the diamond insulation. The diamond provides both good electrical insulation and good thermal conductivity. The methods also provide capacitors with second level diamond dielectrics.

Diamond insulator devices and method of fabrication

Integrated circuit with diamond insulator

A semiconductor-on-insulator structure incorporating a layer of diamond material and method for preparing such. The structure comprises a layer containing diamond material and having a first surface. A layer of silicon nitride is formed on the first surface and a layer of semiconductor material is positioned over the silicon nitride layer. In one embodiment of the method there is provided a removable deposition surface. A layer of crystalline diamond material is formed on the deposition surface. A first surface of the diamond material is separated from the deposition surface. The structure is useful for formation of integrated circuits thereon.

Bonded wafer process incorporating diamond insulator

The amount of extraneous gas within a hermetic sealed package, such as water vapor, is measured by measuring the total gas pressure within the package. This gas pressure is compared to a correlation made of expected total pressure within a package to deviations to that total pressure to determine the amount of extraneous gas. The correlation itself is derived statistically by comparing samples of actual total pressure to expected total pressure. These samples are then used to statistically produce the above correlation which is then used in actual testing.

Growing community of inventors

Melbourne, FL, United States of America

Richard W Belcher