University of Georgia Research Foundation Inc

Richard Speir

Mark Andreas Haidekker

The present disclosure encompasses embodiments of X-ray computed tomography-based methods for the detection of onion quality factors. Such methods are advantageous in detecting internal damage to onion bulbs due to bacterial and fungal rots and mechanical damage while also providing for the overall assessment of onion bulb quality and market value. Because CT images provide cross-sectional reconstructions of the subject under study, CT scans of onion bulbs can be used not only to detect damage from disease, but also cuts and bruises that increase an onion bulb's susceptibility to disease, and the presence of shoots or seed stems and overall shape of the bulbs.

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Loganville, GA, United States of America

Richard Speir