Phillips Petroleum Company

Richard Sanford

Edwin K Clardy

William H Dennis

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A quantitative analysis of the concentration of an eluted component, the dielectric constant of an eluted component and/or the refractive index of the eluted component is obtained using a chromatographic analyzer in combination with both a refractive index detector and a dielectric constant detector without the need to calibrate either the refractive index detector or the dielectric constant detector for each component in a sample. The dielectric constant detector and the refractive index detector are utilized to analyze a sample provided from a chromatographic analyzer. The concentration of the eluted component is a function of the magnitude of the output from each of the detectors. In like manner, the dielectric constant of the eluted component and the refractive index of the eluted component is a function of the output from the two detectors. The magnitude of the output from the two detectors is combined to give the concentration of an eluted component, the dielectric constant of the eluted component and the refractive index of the eluted component without the necessity of calibrating the detectors for each component in a sample.

Chromatographic analysis without calibration using dual detectors

Analysis of the reflectance characteristics of a surface such as a sample of knitted fabric utilizes one or more photosensitive detector means to scan the surface and to automatically produce at least one surface quality signal in response to the reflective characteristics of the surface. In preferred embodiments of the invention a modulated light source is used to illuminate the surface in order to minimize the effect of ambient lighting conditions, and a plurality of detector means are used to obtain a more accurate representation of the quality of the surface being scanned.

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Nineveh, NY, United States of America

Richard Sanford