International Business Machines Corporation

Globalfoundries Inc.

Richard S Wu

Harold Pilo

A fine grained negative wordline scheme for SRAM memories is disclosed. The scheme includes a circuit having a static random access memory (SRAM) cell including at least a wordline coupled to a plurality of NFETs of a transistor array. The circuit further includes a wordline driver including a plurality of inverters coupled between a wordline group decode node, a power supply and the wordline. Overvoltage on the wordline driver and NFETs of the SRAM cell are eliminated by applying a power gating mode and lowering the power supply voltage.

Overvoltage protection for a fine grained negative wordline scheme

A circuit for an integrated circuit power gating system includes a header device connected to a bank of a segmented memory array. The circuit is structured and arranged to: apply a ground input to a gate of the header device to activate the bank, and apply a regulated voltage to the gate of the header device to deactivate the bank. The circuit also includes a precharge circuit that charges the gate of the header device to a precharge voltage that is greater than ground and less than the regulated voltage.

Regulated power gating for growable memory

A voltage regulation circuit and method where a pre-charge device (PCD) and a power gate device (PGD) are connected to a voltage line that supplies power to at least one additional device. The PCD pre-charges the line toward a supply voltage (Vdd) and PGD limits voltage changes on the voltage line caused by leakage current in the additional device(s) and does so differently under different leakage conditions. Specifically, the PGD is controlled by a variable reference voltage (Vref), which is closer to Vdd when a leakage condition is low relative to when the leakage condition is high. Since Vref is relatively high when the leakage condition is low and relatively low when the leakage condition is high, the power gate device will turn on after a smaller amount of voltage change on the voltage line when the leakage condition is low as compared to when the leakage condition is high.

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Winooski, VT, United States of America

Richard S Wu