Infineon Technologies Ag

Richard Roth

Volker Kilian

Stefan Sommer

Lenart Hauptner

A tuning circuit for setting a signal propagation time on a signal line in an integrated circuit, particularly a DRAM circuit, has a transistor and a capacitor. A control connection of the transistor is connected to a control unit for the purpose of switchably connecting the capacitor to the signal line through the transistor in order to set the signal propagation time on the signal line on the basis of application of a control signal, generated in the control unit, to the control connection on the transistor.

Circuit for setting a signal propagation time for a signal on a signal line and method for ascertaining timing parameters

To generate test signals by a test logic unit on a semiconductor wafer, the test signals being used to check specific functions and/or parameters of an integrated circuit on the semiconductor wafer, at least two test signals are provided substantially simultaneously by the test logic unit and are subsequently serialized to generate a multiplexed test signal sequence with a data rate required for testing.

Method for generating test signals for an integrated circuit and test logic unit

In the case of the present-day trend of miniaturizing housed electronic devices, there is the problem that the contact spacings between the terminal pins becomes smaller and smaller and are no longer visible optically. As a result, it also becomes more difficult to solder the contacts of correspondingly designed contact bases, which for example, are designed as test bases, to the individual conductor tracks of the printed circuit board. Possible faulty soldering points, short circuits or interruptions have hitherto been tracked down by laborious manual measurement using the TDR method. The invention proposes producing a test device in which in each case two terminal pins are connected to a short-circuiting bridge. The test device is inserted into the contact base and connects two signal paths of the printed circuit board on which the propagation time of a reflected wave can be measured.

Method and apparatus for finding a fault in a signal path on a printed circuit board

A method and a device for measuring a phase shift between a periodic signal and an output signal at an output of an electronic component. A supply voltage potential is applied to a electronic component, whereby the periodic signal is applied to the output of the electronic component. The current through the supply voltage input is measured, whereby a magnitude of the current corresponds to a phase shift between the periodic signal and the output signal.

Method and device for measuring the phase shift between a periodic signal and an output signal at an output of an electronic component

The invention relates to a method for measuring the junction temperature in an electronic component. A periodic test signal is led via a signal path inside the component in order to obtain an internal signal. There is a frequency and/or phase relationship between the periodic test signal and a periodic external signal. A phase shift is measured between the internal signal and the external signal. The junction temperature is determined over the component region determined by the signal path as a function of the phase shift.

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Unterhaching, Germany

Richard Roth