Avery International Corporation

Richard R Baggarley

Karl Josephy

Earl W McFeaters

Donald E Van Arnam

Apparatus and methods for measuring retroreflective properties of a surface are disclosed. The apparatus and methods are characterized in that the measured angle of divergence is varied while the angle of incidence is simultaneously varied.

Retroreflectometer

A process and apparatus for forming a line of weakness in the protective backing of an adhesive laminate is disclosed. The process is performed by generating a laser beam of sufficient energy to vaporize at least a portion of the protective backing of an adhesive laminate. The laser beam is focused in a focal line extending across the protective backing for a time sufficient for vaporizing at least a portion of the protective backing. At least a portion of the protective backing is vaporized with the laser beam to a depth sufficient for forming a line of weakness in the protective backing along the focal line.

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Arcadia, CA, United States of America

Richard R Baggarley