Teradyne, Inc.

Richard Pye

Brian Charles Wadell

Douglas W Raymond

John Burnett

Michael C Panis

David Walter Lewinnek

Brian Brecht

Randall B Stimson

Heng-Kit Too

Jeffrey S Benagh

Jason D King

Kenneth L Degan

Eric Aldrich

Lyle Sherwood

Roger A Plante

William Patti

Alfred M Zakarian

Mark Garcia

Julie Robison

Shih-Fan Chen

Steven R Shirk

Example automatic test equipment (ATE) includes a first test instrument to receive a waveform from a device under test, where the waveform is based on test signals sent from the ATE to the DUT; circuitry to generate digital pulses based on the waveform; and a second test instrument to receive the digital pulses over at least two digital pins and to process the digital pulses to test the DUT.

Generating a waveform based on digital pulses

An example apparatus includes a first printed circuit board (PCB) having a power layer, a ground layer, and a slot. The slot includes a first power electrical contact that is electrically connected to the power layer and a first ground electrical contact that is connected to the ground layer. The slot extends orthogonally or obliquely through multiple layers of the first PCB. A second PCB includes a second power electrical contact, a second ground electrical contact, and capacitors electrically connected between the second power electrical contact and the second ground electrical contact. The second PCB is configured for insertion into the slot to form an electrical connection between the first power electrical contact and the second power electrical contact and between the first ground electrical contact and the second ground electrical contact.

Connecting circuit boards

An example test system includes instruments for controlling testing. Each instrument may be controlled by a processing unit. Each processing unit may be configured to operate on portions of a test program relevant to an instrument that the processing unit controls. A synchronization mechanism operates with at least some processing units to produce a synchronized sequence of actions, measurements, or measurements and actions at a test instrument interface absent intervention from a centralized controller.

Bus synchronization system that aggregates status

Example automatic test equipment (ATE) includes: a test instrument for outputting test signals to test a device under test (DUT), and for receiving response signals based on the test signals; a device interface board (DIB) connected to the test instrument, with the DIB including an application space having a site to which the DUT connects, and with the test signals and the response signals passing through the site; and calibration circuitry in the application space on the DIB. The calibration circuitry includes a communication interface over which communications pass, with the communications comprising control signals to the calibration circuitry and measurement signals from the calibration circuitry. The calibration circuitry also includes non-volatile memory to store calibration data and is controllable, based on the control signals, to pass the test signals from the test instrument to the DUT and to pass the response signals from the DUT to the test instrument.

Calibration device for automatic test equipment

Techniques for configuring a test system that enable simple specification of a degree of concurrency in testing separate functional portions of a semiconductor device. For a test flow with multiple sub-flows, the pins accessed in connection with each sub-flow may define a flow domain. Site regions, each associated with a flow domain, may be defined. Tester sites may be associated with each of these flow domain specific site regions and independently operating resources may be assigned to these tester sites. A second portion of the defined site regions may be associated with tester sites, but resources assigned to these site regions may be accessed from multiple flow domains. Test blocks, even if not developed for concurrent execution, may be executed concurrently using resources in the flow domain specific site regions. Flexibility is provided to share resources through the use of the second portion of the site regions.

Test system supporting simplified configuration for controlling test block concurrency

An example system for testing camera modules may include: a polygonal structure that is rotatable, where the polygonal structure includes faces, each of which is configured to receive at least one camera module under test; and targets facing at least some of the faces of the polygonal structure, where each target is usable in testing a corresponding camera module facing the each target.

Rotatable camera module testing system

An automated optical inspection (AOI) system includes component learning integrated with the inspection of a circuit board. The AOI system includes a component learning area that can be viewed by an imaging system used to inspect the circuit board in an inspection area. The component learning area can correspond to a region proximate the inspection area. The automated optical inspection system receives board inspection and component learn requests and determines opportune times to learn new component characteristics during the board inspection process so as to minimize the impact of the learning process on the overall inspection efficiency.

Optical inspection system having integrated component learning

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Burlington, MA, United States of America

Richard Pye