Growing community of inventors

Kuna, ID, United States of America

Richard N Hedden

Average Co-Inventor Count = 2.29

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 50

Richard N HeddenAaron M Schoenfeld (9 patents)Richard N HeddenDavid R Cuthbert (9 patents)Richard N HeddenMark T Van Horn (9 patents)Richard N HeddenRichard N Hedden (12 patents)Aaron M SchoenfeldAaron M Schoenfeld (91 patents)David R CuthbertDavid R Cuthbert (27 patents)Mark T Van HornMark T Van Horn (19 patents)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Micron Technology Incorporated (12 from 38,002 patents)


12 patents:

1. 11276450 - Refresh circuitry

2. 10304515 - Refresh circuitry

3. 9741421 - Refresh circuitry

4. 7294790 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

5. 7239152 - Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

6. 7212013 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

7. 7208935 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

8. 7208959 - Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

9. 7199593 - Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

10. 7145323 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

11. 6822438 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer

12. 6563299 - Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer

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as of
12/31/2025
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