Carl Zeiss Microscopy Gmbh

Richard Moralee

William B Thompson

Matthew Andrew

Edward Hill

Joaquin Correa

Champ Gohil

William Thompson

Benjamin Tordoff

Champ Gohill

Benjamin Tordorff

A method of enhancing a resolution of an EDS image of a sample includes generating an EDS image of the sample, generating a non-EDS image of the sample generating, using a machine learning algorithm, an enhanced resolution EDS image of the sample based on the generated feature map and based on the first EDS image, where a resolution of the enhanced resolution EDS image is higher than a resolution of the first EDS image.

Grain-based minerology segmentation system and method

A data analysis system is disclosed for generating analysis data depending on microscopic data of an object generated by a charged particle microscope. The microscopic data includes an image showing a structure. A graphical representation of the structure is displayed on the display by the graphical user interface. Separation data is generated representing at least one path of a separation cut, which separates pixels of the structure from each other. The separation cut is visually marked by the graphical user interface, depending on the separation data, by differently marking different area portions of the representation, which represent different pixels of the structure which are separated from each other by the separation cut. Separate analysis data are generated for each of at least two portions of the object, depending on the microscopic data and depending on the separation data.

Method and data analysis system for semi-automated particle analysis using a charged particle beam

Growing community of inventors

Cambridge, United Kingdom

Richard Moralee