United States of America As Represented by the Secretary of the Air Force

Richard H Picard

Michael Bass

Richard P Hackel

Clare C Leiby, Jr

Shaoul Ezekiel

Rudolph A Bradbury

David Milam

Charles R Willis

A laser stimulated Raman molecular beam time and frequency standard utilizing a first electromagnetic beam at a first preselected frequency to pump a molecular beam at a first preselected point along the beam to state select the beam. A second electromagnetic beam (produced from either a different electromagnetic source than utilized to produce the first beam or produced from a portion of the first beam) at a second preselected frequency and a third electromagnetic beam at the first frequency simultaneously pump the molecules of the state selected molecular beam at a second point along the beam in a stimulated Raman process. By locking the frequency difference of the first and second electromagnetic beams to a specific resonant frequency, a time and frequency standard can be produced.

Laser stimulated Raman molecular beam time and frequency standard

A system is described for determining the mechanism responsible for laser-induced damage in a sample which utilizes a procedure of sequentially irradiating a large number of sites using a tightly focused laser beam whose intensity is constant in time. A statistical analysis of survival times yields a determination that damage was due to one of the following mechanisms:

Method and apparatus for determining the mechanism responsible for

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Bedford, MA, United States of America

Richard H Picard