L-3 Communications Security and Detection Systems Corporation

Vivid Technologies, Inc.

Leidos Security Detection & Automation, Inc.

Richard Franklin Eilbert

Boris Oreper

Richard Robehr Bijjani

Kristoph D Krug

Shunghe Shi

Andrew Dean Foland

Nikolay Rolshud

Jay A Stein

Shuanghe Shi

Jeffrey H Stillson

William F Aitkenhead

Michael R Gambini

David Perticone

Jeff Stillson

Thomas David Plamondon

John Tortora

Alan Roy Sieving

John O Tortora

Kenneth E Prather

Richard Bijjani

Prabhav Morje

Andrew D Foland

Thomas D Plamondon

A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a portion of an inspection volume. A second image including a projection of the portion is generated based on data representing attenuation of lower-energy radiation passing through the portion of the inspection volume. A dual-pixel image is created from the first image and the second image. A region of interest is selected from the dual-pixel image. A first basis function that is derived from an attenuation characteristic associated with the region of interest is selected. The region of interest is represented in terms of an amplitude associated with the first basis function and an amplitude associated with the second basis function.

Examination of a region using dual-energy radiation

In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

Methods and apparatus for e-beam scanning

An inspection system that forms material sensitive X-ray images of items under inspection. The images are decomposed into basis function images using basis functions representative of materials of interest. The decomposed images may be processed separately to detect concentrations of a material of interest corresponding to one or more of the basis functions. When operated in this mode, the inspection system may be used in applications such as material sorting or security screening. At least one basis function is selected to distinguish a material of interest from other materials likely contained with the item, allowing one of the basis function images to be analyzed to obtain information about a specific material of interest. The images may be automatically analyzed or may be superimposed for display with different visual characteristics assigned to the components associated with each basis function for analysis by a human operator.

Reconstruction of x-ray images into basis function components using multiple-energy sources

An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

Radiation scanning systems and methods

Various novel apparatuses and methods for generating X-rays are disclosed. In some embodiments, for example, an apparatus may be configured and arranged so that, for at least one interception point on a particular portion of a scan path on a surface of a target along which a steering element steers an accelerated electron beam (e-beam), both an angle and its complement between a line corresponding to a direction in which the accelerated e-beam is traveling at the interception point and a line oriented normal to the surface of the target at such interception point are greater than forty five degrees.

Compact e-beam source for generating X-rays

A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Selective generation of radiation at multiple energy levels

A method for operating an inspection system is disclosed in which an item under inspection may be moved between radiation sources and detectors illuminated by the sources. The radiation sources may be positioned such that radiation from at least some of the sources impinge on the radiation detectors, forming acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection. The processing may be performed using an algebraic reconstruction technique using an inverse system matrix. The inverse matrix can be derived without first computing a transpose of the system matrix.

Tomographic imaging systems and methods

A security system for detecting contraband such as explosives. The system has a source of radiation and a detector array. A detector array is made of many small detectors, each with a fast response time. The fast response time allows individual radiation photon interactions with each detector to be counted. By counting the number of interactions in an interval of time, the amount of radiation reaching the detector can be measured. The magnitude of the response from the detector to each radiation interaction allows measurement of the energy level of the photons interacting with the detector. Such a system provides significant flexibility in analyzing data collected from items under inspection. For example, objects such as contraband can be identified within the item under inspection by processing the data to accurately determine both the density and type of material.

X-ray imaging technique

A contraband detection system using a cone beam computed tomography scanner. The cone beam scanner allows for rapid acquisition of data for computing three dimensional density maps of objects within items under inspection. Where greater resolution is desired, the image information obtained with the cone beam computed tomography scanner may be combined with higher resolution images formed with a single view scanner. A multi-energy single view scanner may be used to additionally provide information on the effective atomic number of objects contained within items under inspection. Additionally, information obtained with the cone beam computed tomography scanner may be used to increase the accuracy of the computation of the effective atomic number of objects within the item under inspection.

Contraband detection systems using a large-angle cone beam CT system

A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.

Method and apparatus for target transmitting information about a target object between a prescanner and a CT scanner

A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a reconstructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information

Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner

A method or apparatus for analyzing an object includes an X-ray prescanner that performs a prescan of the object to determine prescan information about the object. Then, a CT scanner performs a CT scan on at least one plane of the object based on the prescan information to determine CT information. In one embodiment, if the CT scan of the object includes or is in the vicinity of metal, then metal artifact correction of a constructed image from the CT scan is performed based on the prescan information. In another embodiment, a processor analyzes the CT information and the prescan information to determine whether to update the prescan information based on the CT information.

Growing community of inventors

Lincoln, MA, United States of America

Richard Franklin Eilbert