Spectramet, LLC

Other

Select Technologies Corporation Limited

Richard E Hill

Edward J Sommer, Jr

Charles E Roos

David B Spencer

R Lynn Conley

Robert H Parrish

Jeffrey J Webster

Aldo M Reti

Systems for sorting materials, such as those made of metal, are described. The systems may operate by irradiating the materials with x-rays and then detecting fluoresced x-rays, transmitted x-rays, or both. Detection of the fluoresced x-rays may be performed using an x-ray fluorescence detector array. The systems may be configured to provide high throughput sorting of small pieces of materials.

Material sorting technology

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or to more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

Sorting pieces of material based on photonic emissions resulting from multiple sources of stimuli

A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.

An article sensing and tracking system and computer system integrated and connected to present on a monitor screen, or screens, visual x-ray and photographic images of articles that are being passed through a scanner and visual indication of the physical location of the displayed articles within the system, enabling security personnel viewing a monitor screen to accurately track and maintain custody of the articles, until cleared, through examination of x-ray data and other information relating to the articles.

Method and apparatus for improving identification and control of articles passing through a scanning system

A method and apparatus are disclosed for screening articles such as baggage, utilizing a computerized touch sensitive screen or other computerized pointing device for operator identification and electronic marking of objects within the article to be further examined. Baggage is electromagnetically scanned while traveling on a conveyer and an electronic image is taken of each article and stored in a computer. The present system utilizes a plurality of visual display devices, each with an examiner, which are likely located remotely of the screening operation. Each examination continues independently of the scanning such that there is no interruption in the flow of articles should an examiner detect an object of interest and worthy of further examination, either by screen or by physical examination.

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Nashville, TN, United States of America

Richard E Hill