Advanced Micro Devices Corporation

Richard Charles Kittler

F Walter Smith

Randy Burdick

James Minsu Pak

Ying Shiau

Yung-Tao Lin

Zhi-Min Ling

Data in disparate formats from different data sources are reformatted into a common data format and stored in database servers serving one or more data sources such that each database server contains only a portion of the composite database. A client server and graphical user interface are provided for allowing a client to perform simple search requests on one database server, browse requests on all database servers, or serve complex search requests on one or more database servers. The client server may reformat the resultant search data into one or more specific database formats for retrieval and manipulation by a specific database program or display the information for the client. The present invention has particular application to the semiconductor manufacturing field, for tracking data produced during the processes of semiconductor manufacturing.

Method and system for generating product performance history

An arrangement and method for detecting sequential processing effects on devices to be manufactured in a manufacturing process extracts data regarding responses of the devices to a process step in the manufacturing process and data regarding a processing sequence of the devices in that process step. The extracted data is refined before analysis and control chart rules are then applied to the refined data. These control chart rules detect whether there are any unusual processing effects caused by the sequence of processing of the devices in any one of the individual processing steps. Application of control chart rules to the refined data allows an automatic determination of whether there are any rule violations. One or more control charts which have a rule violation are automatically generated when it is determined that there is a rule violation. Process engineers may then use the automatically generated charts to direct their efforts at improving the manufacturing process.

Arrangement and method for detecting sequential processing effects in

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Sunnyvale, CA, United States of America

Richard Charles Kittler