International Business Machines Corporation

Richard B Bhend

Scott Barnett Swaney

David F Heidel

Jerry Don Ackaret

Jeffrey L Lovgren

Naoko Pia Sanda

John R Mercer

Robert D Keillor

Jane Jones, Legal Representative

Georg Gaebelein, Deceased

A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.

System and method for accelerated detection of transient particle induced soft error rates in integrated circuits

A variable time integrating period to accomplish distortion free synchronization of the scanning rate to the document transport speed when the transport speed is within a predetermined tolerance with respect to it's nominal speed is disclosed. The rate levels provided by the scanner are then multiplied by an appropriate correction factor to compensate for the varied amount of light accumulated by the time integrating photo sensor array because of the varied integration time. When the document speed must be reduced to a value less than the predetermined tolerance, the system of the invention resorts to the techinque of selecting only certain scans and discarding the data from other scans. Scan selection is found to be economically accomplished by selecting those scans which were time integrating when an emitter pulse occurred.

Solid state scanner for a variable speed transport

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Rochester, MN, United States of America

Richard B Bhend