Uchicago Argonne, LLC

U.S. Department of Energy

Richard A Rosenberg

William J Farrell

George A Goeppner

Qing Ma

John R Noonan

An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.

Microscopic infrared analysis by X-ray or electron radiation

A method for joining metal-matrix composites (MMCs) by using high power x-rays as a volumetric heat source is provided. The method involves directing an x-ray to the weld line between two adjacent MMCs materials to create an irradiated region or melt zone. The x-rays have a power density greater than about 10.sup.4 watts/cm.sup.2 and provide the volumetric heat required to join the MMC materials. Importantly, the reinforcing material of the metal-matrix composites remains uniformly distributed in the melt zone, and the strength of the MMCs are not diminished. In an alternate embodiment, high power x-rays are used to provide the volumetric heat required to weld metal elements, including metal elements comprised of metal alloys. In an alternate embodiment, high power x-rays are used to provide the volumetric heat required to weld metal elements, including metal elements comprised of metal alloys.

Growing community of inventors

Naperville, IL, United States of America

Richard A Rosenberg