Tektronix, Inc.

Network Elements, Inc.

Null Networks LLC

Other

Pmk Mess- Und Kommunikationstechnik, Gmbh

Richard A Booman

Michael J Mende

Edward L Hershberg

I Claude Denton

Bruce Murdock

Karl A Rinder

Alfred C She

James L Gimlett

Scott W Lowrey

John J Pickerd

James D Pileggi

Gary W Reed

Stephen F Blazo

Neil C Clayton

Dana L Patelzick

Wayne M Wilburn

Daniel G Knierim

David T Engquist

Michael Dale Stevens

Bruce Clinton Tollbom

Jurij Weber

Kai Klein

Nadja Laaperi

Mark Heimann

Thomas Podrebersek

Michael Engels

Philipp Palffy-Daun-Seiler

Peter Hildenhagen

David R Ohm

Juergen Trueller

Martin Van Pelt

Matthew M Mende

Michael Eube

Frank Pannes

Ernest Charles Gilman

Benno Jacobs

Nicolas Frabasile

Iris Zimmermann

Probe head

Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.

Shielded probe tip interface

The disclosure includes an electro-optical sensor. The electro-optical sensor includes a test signal input to receive a test signal from a device under test (DUT). A bias circuit is employed to generate a bias signal. The electro-optical sensor also includes a Mach-Zehnder Modulator (MZM) that employs an optical input, an optical output, and a bias input. The MZM is configured to receive an optical carrier signal via the optical input. The MZM also receives both the test signal and the bias signal on the bias input. The MZM modulates the test signal from the bias input onto the optical carrier to generate an optical signal while operating in a mode selected by the bias signal. The MZM also outputs the optical signal over the optical output.

High input impedance electro-optic sensor

Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

Wide range compensation of low frequency response passive probe

A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a control unit output port to provide the clamped/limited output signal to an oscilloscope.

Dynamic output clamping for a probe or accessory

A signal acquisition probe stores compressed or compressed and filtered time domain data samples representing at least one of an impulse response or step response characterizing the signal acquisition probe. The compressed or compressed and filtered time domain data samples of the impulse response or the step response are provided to a signal measurement instrument for compensating the signal measurement instrument for the impulse or step response of the signal measurement instrument.

Signal acquisition probe storing compressed or compressed and filtered time domain impulse or step response data for use in a signal measurement system

A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.

Flexible resistive tip cable assembly for differential probing

A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input electrodes, and a bias control unit connected to the control electrodes and configured to reduce an error signal or the input signal bias control signal are electrically combined and applied to a single set of electrodes.

Active noise suppression for optical voltage sensor

An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to transmit the optical signal via a downstream fiber. The electro-optical sensor employs a variation output configured to transmit variation data indicating variation in the received optical carrier to support compensation for corresponding variation in the optical signal.

Electro-optic sensor system

A test and measurement system including an electro-optical accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical accessory with a variable input signal, and a processor. The electro-optical accessory includes two sets of electrodes in which a sensitivity of the first set of electrodes is different from a sensitivity of the second set of electrodes. The processor in the test and measurement system is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.

Electro-optic probe with multiple sensitivity ranges

An electro-optic modulator of a test and measurement system. The electro-optic modulator includes a first electrode, a second electrode with identical electrical characteristics as the first electrode and an optical waveguide between the first electrode and the second electrode. The first electrode and the second electrode present a balanced load to a device under test.

High bandwidth and input impedance electro-optic probe

A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

Differential pin to RF adaptor for probing applications

The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

Isolated probe with digital multimeter or digital voltmeter

A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.

Dynamic compensation circuit

An accessory for use with a test and measurement instrument. The accessory includes an input to receive a signal from a device under test, a calibration unit configured to apply a calibration or compensation signal internal to the accessory, and an output to output the signal from the device under test or the calibration or compensation signal to a test and measurement instrument.

Measurement system including accessory with internal calibration signal

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Lake Oswego, OR, United States of America

Richard A Booman