Meta Platforms Technologies, LLC

Ricardo Garcia

Nadav Grossinger

Robert Nasry Hasbun

Nitay Romano

Niv Kantor

In one embodiment, a system includes at least one projector configured to project a plurality of projected patterns, where a projected lighting characteristic of each of the projected patterns varies over a time period in accordance with an associated predetermined temporal lighting-characteristic pattern, a camera configured to capture images of detected patterns during the time period, and one or more processors configured to: determine, for each detected pattern, a detected temporal lighting-characteristic pattern based on variations in a detected lighting characteristic of the detected pattern, identify a detected pattern that corresponds to one of the projected patterns by comparing at least one of the detected temporal lighting-characteristic patterns to at least one of the temporal lighting-characteristic patterns, and compute a depth associated with the detected patterns based on the one or more of the projected patterns, the detected pattern, and a relative position between the camera and the projector.

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San Bruno, CA, United States of America

Ricardo Garcia