Crane Electronics, Inc.

Reza Ahmadi

Cuon Lam

Sovann Song

Ryan Ricchiuti

A radiation tolerant gate driver for power converters with active-clamp reset and active-driven synchronous rectification uses integrated logic drivers for high efficiency and wide input range. A keep alive circuit prevents power train transistors from remaining on for extended durations after a transient or an undervoltage lockout (UVLO) event. Each of the integrated logic drivers includes two gate driver circuits, where one of the gate driver circuits uses the output of the other of the gate driver circuits as input per a logic table of the integrated logic driver, to ensure no shoot-through when the respective power train transistors are turned on and off.

Radiation tolerant gate drive scheme for active-clamp reset forward topology with active-driven synchronous rectification

A circuit includes a voltage detection path having a first transistor and a second transistor coupled to the first voltage detection path by a first terminal of the second transistor. The first voltage detection path includes: a first current source and a first voltage divider unit coupled to the first current source. The first transistor is coupled to the first voltage divider unit by a first terminal of the first transistor. A first voltage value at a second terminal of the first transistor is configured to switch between a first high voltage value and a first low voltage value at least partially based on a first detection voltage value provided at the first terminal of the first transistor by the first voltage divider unit. A second voltage at a second terminal of the second transistor is configured to switch between a second high voltage value and a second low voltage value at least partially based on the first voltage value at the second terminal of the first transistor.

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Kirkland, WA, United States of America

Reza Ahmadi