Raytheon Company

Rex M Kremer

Eric C Fest

Chadwick B Martin

Jesse C Temkin

A detector assembly includes a dewar chamber having an aperture and an infrared radiation detector. The detector assembly also includes a mirror disposed adjacent the aperture of the dewar chamber, where the mirror has a reflective surface and an emitting region facing the aperture. The infrared radiation detector is configured to detect first radiation and second radiation from the mirror. The first radiation originates from at least one relatively cold surface in the dewar chamber and reflects off the reflective surface of the mirror. The second warm radiation originates from at least one relatively warm surface at or behind the emitting region. The infrared radiation detector is also configured to detect an artifact caused by a particle in the dewar chamber that blocks a portion of the first or second radiation.

Method and apparatus for high sensitivity particulate detection in infrared detector assemblies

The disclosed system and apparatus for a sensor support structure generally includes a substantially reflective support strut having discontinuous protrusions on the support surface presented to the field of view of the sensor. These discontinuous protrusions may be suitably configured such that ambient thermal radiation is generally reflected away from the support strut and divergent from acceptance in the sensor's optical train.

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Tucson, AZ, United States of America

Rex M Kremer