Leica Microsystems (schweiz) Ag

Leica Microsystems Cms Gmbh

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Harald Schnitzler

Robert Paulus

Heinz Zimmermann

The invention relates to an incident illumination device for a microscope, for viewing a sample () in the microscope (), having a planar light source () for incident illumination of the sample (), wherein the planar light source () comprises a panel-shaped light guide having a lower boundary surface (), an upper boundary surface, and at least one lateral surface, as well as at least one light-emitting means that is arranged so that it irradiates light, via at least one lateral surface serving as a light entry surface, into the light guide in such a way that said light propagates in the light guide due to total reflection; wherein the total reflection is disrupted in defined fashion by an element abutting at the lower boundary surface of the light guide against a contact surface so that an outcoupling of light occurs at the upper boundary surface of the light guide.

Incident illumination device for a microscope having a planar light source

An apparatus for producing multiple images of a specimen, having a sliding microtome, is disclosed. The specimen is secured in a specimen holder, movably in a plane. A knife having a cutting edge is arranged above the specimen that is movable along a cutting direction. Provided on the side opposite the cutting edge of the knife is a microscope having a camera for acquiring a respective image of the just-produced cut surface of the specimen.

Apparatus and method for producing multiple images of a specimen

A flat panel light source () for a transillumination device of a microscope comprises a plate-shaped light guide () having a lower and an upper boundary surface, and at least one lateral surface (to), and having at least one light-emitting means () arranged to radiate light into the light guide () from at least two different directions, via at least one lateral surface serving as a light entrance surface, such that the light propagates in the light guide () as a result of total reflection, the total reflection being disrupted in defined fashion, by an element () abutting against a contact surface at the lower boundary surface of the light guide (), so that an outcoupling of light occurs on the upper boundary surface of the light guide (), the planar area of the contact surface being smaller than the planar area of the lower boundary surface.

Flat panel light source for a transillumination device of a microscope

A flat panel light source () for a transillumination device of a microscope comprises a plate-shaped light guide () having a lower and an upper boundary surface and at least one lateral surface (to), and at least one light-emitting means () arranged to radiate light () into the light guide () from at least two different directions, via at least one lateral surface serving as a light entrance surface, such that light propagates in the light guide () by total reflection, the total reflection being disrupted in defined fashion by an element () abutting against a contact surface at the lower boundary surface of the light guide () so an outcoupling of light occurs on the upper boundary surface, the planar area of the contact surface being smaller than that of the lower boundary surface, the element () producing a directed reflection of the light ().

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Widnau, Switzerland

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