Leica Microsystems (Schweiz) Ag

Leica Microsystems Ag

Reto Zuest

Harald Schnitzler

Marc Honegger

Robert Paulus

Ruedi Rottermann

Christian Marte

Robert Lettow

Meinrad Berchtel

A microscope () is described, comprising an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied in such a way that the focusing procedure is executable on the basis of at least a first operating mode and a second operating mode.

Microscope

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to adjust a relative location of the focal plane () with respect to the object plane (), at a focus displacement speed, during the image acquisition time for acquisition of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), the focus displacement speed being equal to the ratio of an increment to the image acquisition time, and the increment being larger than the depth of focus of the microscope ().

A microscope () is described, having an autofocus system () for executing a focusing procedure, having a first image sensor (), arranged in a first outcoupled beam path (), for acquiring a first image (); and a second image sensor (), arranged in a second outcoupled beam path (), for acquiring a second image (). The autofocus system () is embodied to ascertain a contrast difference based on contrast values of the first image () acquired by the first image sensor () and of the second image () acquired by the second image sensor (), and to set a relative location of the focal plane () with respect to the object plane () based on the ascertained contrast difference, the first and the second image () each encompassing image information furnished by the first and the second image sensor () each embodied as an area sensor.

The invention relates to a eucentric digital microscope () that encompasses a stationary stand body () and a pivot unit () mounted pivotably on the stand body (), the pivot unit () being mounted rotatably around a rotation axis () extending in a Y direction. The pivot unit () encompasses at least an optical system having an optical axis () extending orthogonally to the rotation axis (), and a focal plane (), the pivot unit () being arranged nondisplaceably at least in an X direction and in a Z direction relative to the rotation axis ().

Eucentric digital microscope having a pivotally mounted pivot unit

A microscope () is described, having an aperture limiter (), arranged in the beam path (), for generating at least one optical channel (). The aperture limiter () is embodied to set the aperture of the at least one optical channel (). The aperture limiter () is furthermore embodied in such a way that in a first operating mode a first optical channel, and in a second operating mode at least one second optical channel, is selectively generable. The aperture limiter is also arranged in the pupil plane of the beam path.

Microscope having an aperture limiter

A method for calibrating a microscope apparatus () having a variable optical magnification system () and a detector device () is disclosed. First, a calibrating mode is performed, wherein an image () of an object () is captured at a known reference magnification value, two characteristic reference points () are determined in the image, a reference distance () between the two reference points is determined, and a correlation is determined between the reference distance and the reference magnification value. Later, a measuring mode is implemented, in which a current image () of the object () is captured at a second magnification value, the two characteristic reference points () are identified therein, a current distance () between the current reference points is determined, and the second magnification value is determined from the current distance () based on the correlation between the reference distance () and the reference magnification value.

Method for self-calibration of a microscope apparatus

A microscope includes an image acquisition system, microscope components and a touch screen. The image acquisition system is configured to optically and digitally image an object so as to produce an object image The microscope components are at least one of motorized and electrically controllable. The touch screen is configured to display the object image in a display area thereof and to sense inputs in the display area within the displayed object image so as to change settings of the microscope components.

Microscope having a touch screen

The present invention relates to an illumination device () for a microscope (), including at least one light source () and a reflector () for providing diffuse illumination, said reflector at least partially surrounding the observation beam path (OA) between a microscope objective () and an object () to be observed. The reflector () is at least partially elastic and capable of being reversibly transformed from at least a first form to at least a second form.

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Diepoldsau, Switzerland

Reto Zuest