Koninklijke Philips Corporation N.v.

Rene Johan Gerrit Elfrink

Mark Thomas Johnson

Herbert Lifka

Freddy Roozeboom

Peter Dirksen

Casparus Anthonius Henricus Juffermans

ICs () are nearly separated from the semiconductor substrate () on/in which they are formed. Subsequently, the substrate is positioned upside down on a substrate (carrier) () which is provided with glue () at the location of a crystal. After attachment of the crystal to the carrier, the semiconductor substrate is removed and the crystal remains attached to the carrier e.g. at the crossing of rows and columns. The separate crystals may contain TFTs (simple AM addressing) but also more complicated electronics (address of pixel in memory+identification).

Method of manufacturing a display device including forming electric connections on a substrate, conductor patterns on a second substrate and coupling the connections

The performance of a scanning electron microscope (SEM) () is determined by scanning, with this SEM, porous silicon surface areas (PS, PS) each having a different average pore size, calculating the Fourier transform spectra (F) of the images of the surface areas and extrapolating the resolution (R) at a zero signal-to-noise ratio (SNR) from the width (W(1/e)), the signal amplitude (Sa) and the noise offset (NL) of the spectra. A test sample provided with the different surface areas is obtained by anodizing a silicon substrate (Su) at a constant electric current, while continuously decreasing the substrate area exposed to the etching electrolyte (El).

Method of measuring the performance of a scanning electron microscope

ICs ( ) are nearly separated from the semiconductor substrate ( ) on/in which they are formed. Subsequently, the substrate is positioned upside down on a substrate (carrier) ( ) which is provided with glue ( ) at the location of a crystal. After attachment of the crystal to the carrier, the semiconductor substrate is removed and the crystal remains attached to the carrier e.g. at the crossing of rows and columns. The separate crystals may contain TFTs (simple AM addressing) but also more complicated electronics (address of pixel in memory&plus;identification).

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Eindhoven, Netherlands

Rene Johan Gerrit Elfrink