Texas Instruments Corporation

Rejitha Nair

Venkateswar Reddy Kowkutla

John Chrysostom Apostol

Kazunobu Shin

Siva Srinivas Kothamasu

Chunhua Hu

Varun Singh

Raghavendra Santhanagopal

Jason Lynn Peck

Anthony Frederick Seely

Nishanth Menon

Rajesh Kumar Vanga

Charles Gerlach

David Matthew Thompson

Jose Luis Flores

Devanathan Varadarajan

Venkateswara Reddy Pothireddy

Shriram D Moharil

Santhanagopal Raghavendra

Ravi Teja Reddy

Rajagopal Kollengode Ananthanarayanan

A circuit device is provided and includes a first power domain comprising a universal serial bus (USB) subsystem and/or a memory controller subsystem. The first power domain is configured to isolate the USB subsystem and/or the memory controller subsystem from a power-on-reset signal asserted during a low power mode.

Power-on-reset signal isolation during lower power mode

A system, e.g., a system on a chip (SoC) includes a first domain including a first processor configured to boot the system; a second domain including a processing subsystem having a second processor; and isolation circuitry between the first domain and the second domain During boot-up of the system, the first processor provides code to the second domain. When the code is executed by the second processor, it configures the processing subsystem as either a safety domain or as a general-purpose processing domain. The safety domain may an external safety domain or an internal safety domain.

System on a chip with an integrated configurable safety master microcontroller unit

An integrated circuit comprises a set of processor cores, wherein each processor core of the set of processor cores includes BIST logic circuitry and multiple memory blocks coupled to the BIST logic circuitry. Each processor core further includes multiple power control circuitry, where each power control circuitry of the multiple power control circuitry is coupled to a respective processor core of the set of processor cores, multiple isolation circuitry, where each isolation circuitry of the multiple isolation circuitry is coupled to a respective processor core of the set of processor cores, a built-in-self repair (BISR) controller coupled to the each of the set of processor cores, each of the multiple power control circuitry, and each of the multiple isolation circuitry, and a safety controller coupled to the BISR controller, the multiple power control circuitry, and to the multiple isolation circuitry.

Distributed mechanism for fine-grained test power control

An integrated circuit includes a processor core configured to perform boot operations; and a microcontroller coupled to a processor core. The microcontroller includes: a set of microcontroller components; and a state machine coupled to the set of microcontroller components. The state machine is configured to perform self-test operations on the set of microcontroller components before the boot operations.

Integrated circuit with state machine for pre-boot self-tests

In described examples, an integrated circuit (IC) includes an isolation, an input/output (IO), and a low power mode (LPM) control logic. The isolation includes a level shift with pull-down configured to weakly pull down the voltage of signals that travel through the isolation. The IO includes an input and a physical connector for coupling to a power management IC. The IO provides an asserted-low LPM enable signal to the physical connector in response to the IO input. An output of the LPM control logic is coupled via the isolation to the input of the IO. The LPM control logic provides a high voltage signal to the input of the IO as a default during power on reset (POR) of the IC. The pull-down pulls the LPM enable signal voltage to the asserted low voltage in response to a voltage of the LPM enable signal falling below a threshold.

Integrated circuit with low power mode management

An electronic device comprising one or more subcircuits configured to receive a clock signal, the clock signal configured to switch from a reference clock signal to a second clock signal based on a clock bypass signal, a timer configured to receive the reference clock signal and output an alignment signal based on the reference clock signal, wherein a frequency of the alignment signal is determined based on clock frequencies of the one or more subcircuits; a clock alignment module coupled to the timer and the one or more subcircuits and configured to receive the clock bypass signal, determine that the clock bypass signal has changed to switch the one or more subcircuits to the reference clock signal from the second clock signal, block the clock signal from being received by the one or more subcircuits, receive the alignment signal, and unblock the clock signal based on the alignment signal.

Technique for clock alignment supporting reset isolation

A system on a chip (SoC) includes a first domain comprising a first processor configured to boot the SoC, and a first debug subsystem, a second domain comprising a second processor, the second domain configurable as either a safety domain or a general-purpose processing domain, and isolation circuitry between the first domain and the second domain. During boot-up of the SoC, the first processor provides code to the second domain which, when executed by the second processor, configures the second domain as either a safety domain or as a general-purpose processing domain.

An embodiment of the invention provides a method of operating a Galois field multiplier in a processor. An n bit multiplier and an n bit multiplicand are received during a first group of one or more clock cycles. An (2n&#x2212;1) bit product is calculated based on the n bit multiplicand and the n bit multiplier. The (2n&#x2212;1) bit product is stored in a first memory element during the first group of one or more clock cycles. An n bit polynomial value is received during a second group of one or more clock cycles. During the second group of one or more clock cycles, the (2n&#x2212;1) bit product is divided by the n bit polynomial value producing an n bit result. The n bit result is stored in a second memory element during the second group of one or more clock cycles.

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Southlake, TX, United States of America

Rejitha Nair