Dr. Johannes Heidenhain Gmbh

Johannes Heidenhain Gmbh

Other

Carl Zeiss Jena Gmbh

Dr. Johanns Hudenheim Gmbh

Reiner Burgschat

Robert Stelzner

Peter Speckbacher

Manfred Matz

Wolfgang Holzapfel

Elmar Josef Mayer

Dieter Michel

Josef Weidmann

Andreas Schmidt

Wolfgang Brode

Mathias Krauss

Joerg Willhelm

Ludwig Böge

Janos Böhme

Wolfgang Sachse

Werner Metzner

G&uuml;nter Schwarzrock

Christopher Eisele

A scanning head for an optical position-measuring system includes a receiver grating, formed of photosensitive areas, for the scanning of locally intensity-modulated light of differing wavelengths. The receiver grating is formed from a semiconductor layer stack of a doped p-layer, an intrinsic i-layer and a doped n-layer. The individual photosensitive areas have a first doped layer and at least a part of the intrinsic layer in common and are electrically separated from one another by interruptions in the second doped layer.

Scanning head for optical position-measuring systems

A scanning device for scanning a scale graduation for detecting relative movements of the scanning device with respect to the scale graduation. The scanning device includes a first primary sensor field and a second primary sensor field used for detecting relative movements along a first spatial direction. A first secondary sensor field and a second secondary sensor field for detecting relative movements along a second spatial direction, which is linearly independent of the first spatial direction. The first primary sensor field, the second primary sensor field, the first secondary sensor field and the second secondary sensor field are arranged point-symmetrically in relation to a mid-point in a plane.

Scanning device for scanning a scale graduation, and position measuring system utilizing the same

An optical position measuring arrangement that includes an incremental measuring graduation and a scanning unit, which can be moved in relation to the incremental measuring graduation along a measuring direction and by which position-dependent incremental signals are generated from scanning the measuring graduation. The scanning unit includes a transparent support substrate and two incremental signal scanning arrangements arranged in the measuring direction. Each of the incremental scanning arrangements includes a light source and several incremental signal detector elements, wherein the incremental signal scanning arrangements are arranged on a side of the support substrate facing away from the incremental measuring graduation. The scanning unit includes several fields with scanning gratings, each field is spatially assigned to corresponding incremental signal detector elements and is arranged between the incremental signal scanning arrangements and the support substrate, wherein the scanning gratings are arranged so that partial incremental signals with predetermined phase relations are generated from the incremental signal detector elements.

Optical position measuring device

A device for the directional attachment of a scale element of a linear position measuring system to an installation face of a first body. The device includes a first body, a second body comprising a scanning head, which is movable in a measuring direction in relation to said first body, and a scale element is aligned parallel with respect to the measuring direction and a profiled alignment device is provided on the second body, which works together with a complementary tape profile on the scale element for aligning the scale element.

Device and method for attaching a scale element or a protective tape therefor

A circuit arrangement for the correction of periodic signals from an incremental position measuring system that includes a first assembly comprising a multiplexer having an input to which a periodic signal is supplied and an output out of which an output signal is transmitted, a second assembly that receives the output signal and compares the output signal with at least one preset threshold value and, the second assembly selects a manipulated variable as a function of an actual position of a signal parameter in relation to the at least one preset threshold value from at least two preset, different manipulated variables and an actuating member that performs an action on the signal parameter in order to adjust the signal parameter in a direction toward a preset setpoint value.

Method and circuit for correcting periodic signals of an incremental position measuring system

A method for the directional attachment of a scale element of a position measuring system to an installation face of a first body. The method includes aligning a scale element on an installation face of a first body parallel to a measuring direction via an adjustment device provided on a second body, which has a scanning head provided thereon and is movable in the measuring direction in relation to the first body. Attaching the aligned scale element to the installation face, wherein the adjustment device is in an alignment position with respect to the second body during the attaching. Positioning the adjustment device into a position of rest with respect to the second body subsequent to the attaching, wherein the position of rest is different from the alignment position.

Method and device for attaching a scale element

A method for generating an indication regarding the amplitude level of at least one scanning signal of a position measuring system by determining an amplitude level of at least one scanning signal of a position measuring system, generating an amplitude signal based on the determined amplitude level. Forming a deviation signal by comparing the generated amplitude signal with a predetermined nominal signal and providing an indication of a proper set-up of a scanning head of the position measuring system as a function of the deviation signal, wherein with a weak deviation signal, a change in the deviation signal causes a small, or no variation of the indication, and in contrast thereto a larger variation of the indication is caused by a stronger deviation signal.

Control device of a position measuring system

An optoelectronic component that includes a substrate having a first optoelectronic component, a second optoelectronic component arranged next to the first optoelectronic component and a contact point. A support of the substrate includes a second contact point, wherein the second contact point is located opposite to the first contact point and is in electrical connection with the first contact point. An underfiller in a space between the substrate and the support, the underfiller forms a border area between the substrate and the support toward a space free of underfiller, wherein the border area restricts the space free of underfiller of at least one of the first and second optoelectronic components.

Optoelectronic component with a space kept free from underfiller

A position measuring system for determining the relative position of a first object and a second object movable relative to one another that includes an incremental track, associated with a first object and having a periodic line structure that has individual lines and a scanning unit, associated with a second object movable relative to the first object, that scans said periodic line structure and that generates a corresponding incremental signal. A sensor system that generates absolute position information pertaining to the relative position of the first and second objects, wherein the width of the individual lines, as measured along a longitudinal direction of the incremental track, varies over at least a portion of the breadth of the incremental track, as measured in a direction transverse to the longitudinal direction, in such a way that a structure with absolute position information is superimposed on the periodic line structure.

Position measuring system

A scanning unit for an optical position measuring device, which is suitable for scanning a scale in a measurement direction. The scanning unit includes a light source, an incremental signal scanning arrangement, disposed symmetrical around the light source and including a plurality of incremental signal detector elements, which are each disposed relative to one another so that phase-offset partial incremental signals are generated from the scanning of an incremental grating line of a scale. A first reference pulse detector element and a second reference pulse detector element, each of which is disposed vertically to a measurement direction and are each adjacent to the incremental signal scanning arrangement and generate an output reference pulse signal from the scanning of a first reference marking and a second reference marking located at one or more defined reference positions of the scale.

Scanning unit for optical position measuring device

A three-dimensional measuring module includes an optical chip arranged spatially above a scanning plate and a signal processing assembly arranged above the optical chip. A housing completely encloses the optical chip and the signal processing assembly as well as a scanning plate. The electrical connecting lines between the optical chip and the signal processing assembly are routed via the scanning plate and the interior side of the housing to the signal processing assembly. The output signals of the signal processing assembly are conveyed via connecting lines to contacts on the exterior side of the housing. The conductive lines between the optical chip and the signal processing assembly can be kept very short, so that line resistance and interference coupling are reduced.

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Jena, Germany

Reiner Burgschat