Honeywell International Inc.

Valtion Teknillinen Tutkimuskeskus

Honeywell Oy

Roibox Oy

Reijo Kuusela

Pertti Puumalainen

Kari Kataja

Jouko Malinen

Sini Kivi

Hannu Vasama

An optical or infrared spectrometer is suitable for on-line measurements for industrial, agricultural, field, commercial and other applications. Optical spectrometers are very useful for various analytical measurements. On-line operation is needed for obtaining real-time information, which is useful e.g. for process automation and quality control needs. The invention is based on optical design optimized for measuring moving samples at a distance and includes a light guide for signal homogenization, a linear variable filter for defining multiple measurement wavelengths as well as a linear detector array for detecting optical signals relating to the different wavelengths. There is an element for cooling and stabilizing the operating temperature of both the linear detector array and the linear variable filter, while the spectrometer is operating in variable environmental conditions. Thanks to the optical signal chain designed to maximize the radiance at the detector, the proposed spectrometer can provide high signal-to-noise ratio and high speed.

Spectrometer for measuring moving sample material and the method

Microgloss is a novel two-dimensional representation of how light is reflected from a target surface area. Systems and methods for measuring the microgloss can yield data for characterizing the reflective properties of a variety of products for which surface appearance is important. These products include paper, plastics, metals, and ceramics. Microgloss characteristics can be used as parameters for controlling the supercalendering process in papermaking. Microgloss characteristics can be used in conjunction with standard gloss to classify products.

Microgloss measurement of paper and board

The devices, systems and methods may continuously detect surface characteristics of a sample surface at a tilt. The exemplary system may have a conveying device for moving a sample surface, a light source for reflecting a beam of light off the sample surface, and a light detector with a light detection surface for continuous light detection. A lens may be used to reflect the beam of light from the sample surface and focus the beam of light on the light detection surface of the light detector. The area of the beam of light at the point of focus on the light detection surface may be unequal to the light detection surface. A reference analyzer may be used to determine the optical surface based on a comparison of the reflected light received with known reflected light values for known sample surfaces.

Pass-line and tilt insensitive sensor

Devices, systems and methods for detecting surface characteristics of a sample surface are disclosed. The exemplary system may have a conveying device for moving a sample surface and a light source for reflecting a beam of light off the sample surface. A light detector may receive the beam of light reflected from the sample surface. The area of the beam of light may be unequal to an area of a light detection surface of the light detector. A reference analyzer may determine the optical surface based on a comparison of the reflected light received with known reflected light values for known sample surfaces.

Pass-line insensitive sensor

The object of the invention is a method for measuring humidity in material to be produced in the form of a web, particularly paper and carton material. According to the method, a chopper in part cuts infrared light brought on the other side of the web through an opal glass window from an infrared source. The radiation is measured in an analysis part placed adjacent a second opal glass window. Humidity in the web is measured by measurement of the measuring and reference wavelengths; intensities with a measuring analyzer and a reference analyzer and simultaneously adjusting the viewing angles of the analyzers in such a manner, that when the position of the material web between the opal windows is changed, the same value for the humidity is obtained. The wavelengths between the measuring and reference channels have been chosen so that they are as near as possible to each other.

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Kuopio, Finland

Reijo Kuusela